Industrial Anomaly Detection System: A Multicase Algorithm Leveraging Feature Information and Memory Bank

The conventional anomaly detection (AD) methods typically rely on training normal samples without defects to identify deviations from the background. However, these methods suffer from issues, such as missing detection or false detection. Although subsequent research has attempted to improve algorithm performance, this often results in overfitting to specific cases within the AD framework. To address these challenges, this article proposes a semi-supervised AD algorithm that combines improved metric learning techniques with a memory bank (MB) update module. In order to enhance the algorithm’s generalization capabilities across different cases, a multicases MB inheritance approach is introduced. This approach facilitates rapid generalization to unknown test cases with minimal iterative learning (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\le 5$ </tex-math></inline-formula> epochs). Additionally, a bank-case matching module is designed to select the appropriate MB and calculate anomaly scores within our framework. The effectiveness of the proposed algorithm has been validated through real industrial tests and ablation experiments, demonstrating its capability in detecting anomalies accurately and reliably. Code is available on: <uri xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">https://github.com/FrankCloud-UESTC/Multi-case-AD</uri>.

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Publication Details

Journal
IEEE Transactions on Instrumentation and Measurement
Published
2025-01-01
DOI
https://doi.org/10.1109/tim.2025.3551852
Citations
7
Primary Topic
Anomaly Detection Techniques and Applications
Type
article
Field-Weighted Citation Impact
17.37
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article

Industrial Anomaly Detection System: A Multicase Algorithm Leveraging Feature Information and Memory Bank

Yunhan Shi, Bin Gao, Geng Yang, Wai Lok Woo et al.
7 citations
IEEE Transactions on Instrumentation and Measurement
Anomaly Detection Techniques and Applications
17.37
article

Industrial Anomaly Detection System: A Multicase Algorithm Leveraging Feature Information and Memory Bank

Yunhan Shi, Bin Gao, Geng Yang, Wai Lok Woo, Haoran Li
article en
7 citations

Abstract

The conventional anomaly detection (AD) methods typically rely on training normal samples without defects to identify deviations from the background. However, these methods suffer from issues, such as missing detection or false detection. Although subsequent research has attempted to improve algorithm performance, this often results in overfitting to specific cases within the AD framework. To address these challenges, this article proposes a semi-supervised AD algorithm that combines improved metric learning techniques with a memory bank (MB) update module. In order to enhance the algorithm’s generalization capabilities across different cases, a multicases MB inheritance approach is introduced. This approach facilitates rapid generalization to unknown test cases with minimal iterative learning (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\le 5$ </tex-math></inline-formula> epochs). Additionally, a bank-case matching module is designed to select the appropriate MB and calculate anomaly scores within our framework. The effectiveness of the proposed algorithm has been validated through real industrial tests and ablation experiments, demonstrating its capability in detecting anomalies accurately and reliably. Code is available on: <uri xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">https://github.com/FrankCloud-UESTC/Multi-case-AD</uri>.

IEEE Transactions on Instrumentation and MeasurementVol. 74
University of Electronic Science and Technology of China (CN), Northumbria University (GB)
Openalex Percentile: Top 1%
Anomaly Detection Techniques and Applications
17.37
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Industrial Anomaly Detection System: A Multicase Algorithm Leveraging Feature Information and Memory Bank — Yunhan Shi, Bin Gao, et al. · IEEE Transactions on Instrumentation and Measurement (2025) | TGRS Research Map | TGRS