Indirect Test Pattern Generation for Mixed-Signal Circuits Using Machine Learning

Editor’s notes: This article presents a machine-learning-based approach for generating indirect test patterns in analog and mixed-signal circuits. The method leverages a low-cost test generation tool to simulate circuit specifications and parametric measures, while accounting for variability through Monte Carlo simulations. —Ney Calazans, Federal University of Santa Catarina (UFSC), Brazil —Bruno Zatt, Federal University of Pelotas (UFPel), Brazil

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Publication Details

Journal
IEEE Design and Test
Published
2025-03-17
DOI
https://doi.org/10.1109/mdat.2025.3551949
Citations
1
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
2.27

Funders

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article

Indirect Test Pattern Generation for Mixed-Signal Circuits Using Machine Learning

Lucas B. Zilch, Tiago R. Balen, Állan F. G. Ferreira, Marcelo Lubaszewski
1 citations
IEEE Design and Test
VLSI and Analog Circuit Testing
2.27
article

Indirect Test Pattern Generation for Mixed-Signal Circuits Using Machine Learning

Lucas B. Zilch, Tiago R. Balen, Állan F. G. Ferreira, Marcelo Lubaszewski
article en
1 citations

Abstract

Editor’s notes: This article presents a machine-learning-based approach for generating indirect test patterns in analog and mixed-signal circuits. The method leverages a low-cost test generation tool to simulate circuit specifications and parametric measures, while accounting for variability through Monte Carlo simulations. —Ney Calazans, Federal University of Santa Catarina (UFSC), Brazil —Bruno Zatt, Federal University of Pelotas (UFPel), Brazil

IEEE Design and TestVol. 42(4)
Universidade Federal do Rio Grande do Sul (BR)
Coordenação de Aperfeiçoamento de Pessoal de Nível Superior, Conselho Nacional de Desenvolvimento Científico e Tecnológico, Fundação de Amparo à Pesquisa do Estado do Rio Grande do Sul
Openalex Percentile: Top 17%
VLSI and Analog Circuit Testing
2.27
DOISourceOpenAlex
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Indirect Test Pattern Generation for Mixed-Signal Circuits Using Machine Learning — Lucas B. Zilch, Tiago R. Balen, et al. · IEEE Design and Test (2025) | TGRS Research Map | TGRS