A Bayesian framework to model variance of grain yield response to plant density

Modeling grain yield response to plant density with the proposed framework is suitable for heteroscedastic data scenarios. Future research may focus on exploring how genotypes, environments and their interaction modulate the difference between AOPD and minRPD and, extend the framework to a variety of processes involving crop management decisions.

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Publication Details

Journal
Plant Methods
Published
2025-03-17
DOI
https://doi.org/10.1186/s13007-025-01355-y
Citations
1
Primary Topic
Wheat and Barley Genetics and Pathology
Type
article
Field-Weighted Citation Impact
1.75

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article

A Bayesian framework to model variance of grain yield response to plant density

Nicolas Giordano, Lucas A. Haag, Trevor J. Hefley, Brian L. Beres et al.
1 citations
Plant Methods
Wheat and Barley Genetics and Pathology
1.75
article

A Bayesian framework to model variance of grain yield response to plant density

Nicolas Giordano, Lucas A. Haag, Trevor J. Hefley, Brian L. Beres, Romulo P. Lollato, Josefina Lacasa, Deborah C. Hayes
article en
1 citations

Abstract

Modeling grain yield response to plant density with the proposed framework is suitable for heteroscedastic data scenarios. Future research may focus on exploring how genotypes, environments and their interaction modulate the difference between AOPD and minRPD and, extend the framework to a variety of processes involving crop management decisions.

Plant MethodsVol. 21(1)
Agriculture and Agri-Food Canada (CA), Kansas State University (US), Université Bourgogne Franche-Comté (FR), Lethbridge Research and Development Centre
Kansas Wheat Commission
Responsible consumption and production
Openalex Percentile: Top 17%
Wheat and Barley Genetics and Pathology
1.75
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