Convergence properties of ePIE and stochastic gradient methods for blind ptychography

We consider blind ptychography, an imaging technique which aims to reconstruct an object of interest from a set of its diffraction patterns each obtained by a local illumination. As the distribution of the light within the illuminated region, called the window, is not known, it has to be estimated as well. For the recovery, a minimization of amplitude-base squared loss via gradient and stochastic gradient descent methods is considered. In particular, this includes extended Ptychographic Iterative Engine as a special case of stochastic gradient descent. We show that with a proper choice of step sizes, all methods converge to a critical point at a sublinear rate and discuss possibilities for larger step sizes.

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Publication Details

Journal
Analysis and Applications
Published
2025-03-13
DOI
https://doi.org/10.1142/s0219530525500216
Citations
1
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
Field-Weighted Citation Impact
1.88
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article

Convergence properties of ePIE and stochastic gradient methods for blind ptychography

Oleh Melnyk
1 citations
Analysis and Applications
Advanced X-ray Imaging Techniques
1.88
article

Convergence properties of ePIE and stochastic gradient methods for blind ptychography

Oleh Melnyk
article en
1 citations

Abstract

We consider blind ptychography, an imaging technique which aims to reconstruct an object of interest from a set of its diffraction patterns each obtained by a local illumination. As the distribution of the light within the illuminated region, called the window, is not known, it has to be estimated as well. For the recovery, a minimization of amplitude-base squared loss via gradient and stochastic gradient descent methods is considered. In particular, this includes extended Ptychographic Iterative Engine as a special case of stochastic gradient descent. We show that with a proper choice of step sizes, all methods converge to a critical point at a sublinear rate and discuss possibilities for larger step sizes.

Analysis and ApplicationsVol. 24(03)
Helmholtz Zentrum München (DE), Technische Universität Berlin (DE)
Openalex Percentile: Top 19%
Advanced X-ray Imaging Techniques
1.88
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