Universal adjustment model for visual photogrammetry and application in three-dimensional high-accuracy measurement of spatial targets

In order to meet the high-precision measurement requirements of point and line targets for particle accelerators, the visual photogrammetry system for three-dimensional measurement is proposed, and the data processing algorithm is investigated. First, based on the images collected by visual measurement, the pixel observations are converted into universal angle observations. An observation model for points based on angle observations is proposed, and the relation between angle observations and global coordinates is established. Then, a spatial straight line of a four-parameter expression method is proposed, and an offset observation model for the line is established. Finally, based on the principle of indirect adjustment, error equations are established, and an overall adjustment solution is achieved for point targets and line targets. Experimental results show that the coordinate component differences are within 25 μm for point targets when comparing the coordinates measured by this system with those measured by a three-coordinate machine. The differences for line targets are within 10 μm in the transverse direction but large in vertical, possibly due to the influence of the illumination. The universal adjustment method for three-dimensional visual measurement proposed in this paper extends the measurement capability from point targets to line targets, providing a comprehensive solution for both types of targets. This method can also be applied for the data processing of multi-system combination measurements of visual photogrammetry systems and laser trackers, leveraging the strengths of different measurement systems and having broad application prospects.

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Publication Details

Journal
AIP Advances
Published
2025-03-01
DOI
https://doi.org/10.1063/5.0262836
Primary Topic
Optical measurement and interference techniques
Type
article
Field-Weighted Citation Impact
0.00

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article

Universal adjustment model for visual photogrammetry and application in three-dimensional high-accuracy measurement of spatial targets

Chengyao Deng, Jing Liang, Tong Wang, Yubo Xing et al.
AIP Advances
Optical measurement and interference techniques
article

Universal adjustment model for visual photogrammetry and application in three-dimensional high-accuracy measurement of spatial targets

Chengyao Deng, Jing Liang, Tong Wang, Yubo Xing, Xiaolong Wang, Na Wang, Dong Lan, Zili Zhang, Li Xiao, Luyan Zhang, Yixin Ma, Na Ma, Shenghong Fan, Shang Lu, Weihu Zhou
article en

Abstract

In order to meet the high-precision measurement requirements of point and line targets for particle accelerators, the visual photogrammetry system for three-dimensional measurement is proposed, and the data processing algorithm is investigated. First, based on the images collected by visual measurement, the pixel observations are converted into universal angle observations. An observation model for points based on angle observations is proposed, and the relation between angle observations and global coordinates is established. Then, a spatial straight line of a four-parameter expression method is proposed, and an offset observation model for the line is established. Finally, based on the principle of indirect adjustment, error equations are established, and an overall adjustment solution is achieved for point targets and line targets. Experimental results show that the coordinate component differences are within 25 μm for point targets when comparing the coordinates measured by this system with those measured by a three-coordinate machine. The differences for line targets are within 10 μm in the transverse direction but large in vertical, possibly due to the influence of the illumination. The universal adjustment method for three-dimensional visual measurement proposed in this paper extends the measurement capability from point targets to line targets, providing a comprehensive solution for both types of targets. This method can also be applied for the data processing of multi-system combination measurements of visual photogrammetry systems and laser trackers, leveraging the strengths of different measurement systems and having broad application prospects.

AIP AdvancesVol. 15(3)
Changchun University of Science and Technology (CN), Chinese Academy of Sciences (CN), China Spallation Neutron Source (CN), University of Chinese Academy of Sciences (CN), Spallation Neutron Source
Basic and Applied Basic Research Foundation of Guangdong Province
Openalex Percentile: Top 96%
Optical measurement and interference techniques
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