A Multiple Instance Learning Approach to Study Leaf Wilt in Soybean Plants

Recent years have seen significant technological advancements in precision farming and plant phenotyping. Remote sensing along with deep learning (DL) techniques can increase phenotyping efficiency and help on-farm decision making with rapid stress detection. In this work, we use these techniques to evaluate drought stress in soybean plants, a crop whose yield is significantly affected by water availability. Images were taken from a high vantage in the field at various times throughout the day. Each image is given a wilting score ranging from 0 to 4 by expert scorers. We implement a DL method called multiple instance learning (MIL) to perform wilt classification as well as generate heat maps that highlight wilt levels in specific regions of the image. Given the significant overlap between adjacent classes in our dataset, we were able to achieve an overall classification accuracy of 64% and a one-off accuracy of 96% on our holdout test set. Our model outperformed DenseNet121 in most metrics, and provided comparable performance to a vision transformer (ViT) while having fewer parameters overall, less complexity (useful for edge implementations), and some interpretability. Furthermore, we were able to show that our model outperformed expert human annotators by predicting more consistent and accurate wilt levels when considering single-image re-annotation. The results show that our proposed methodology can be a useful approach in detecting drought stress in soybean fields to facilitate efficient crop management and aid selection of drought-resilient varieties.

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Publication Details

Journal
Agriculture
Published
2025-03-13
DOI
https://doi.org/10.3390/agriculture15060614
Primary Topic
Leaf Properties and Growth Measurement
Type
article
Field-Weighted Citation Impact
0.00

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article

A Multiple Instance Learning Approach to Study Leaf Wilt in Soybean Plants

Sanjana Banerjee, Edgar Lobatón, Anna M. Locke, Chris Reberg‐Horton et al.
Agriculture
Leaf Properties and Growth Measurement
article

A Multiple Instance Learning Approach to Study Leaf Wilt in Soybean Plants

Sanjana Banerjee, Edgar Lobatón, Anna M. Locke, Chris Reberg‐Horton, Steven Brian Mirsky, Paula Giraldo
article en

Abstract

Recent years have seen significant technological advancements in precision farming and plant phenotyping. Remote sensing along with deep learning (DL) techniques can increase phenotyping efficiency and help on-farm decision making with rapid stress detection. In this work, we use these techniques to evaluate drought stress in soybean plants, a crop whose yield is significantly affected by water availability. Images were taken from a high vantage in the field at various times throughout the day. Each image is given a wilting score ranging from 0 to 4 by expert scorers. We implement a DL method called multiple instance learning (MIL) to perform wilt classification as well as generate heat maps that highlight wilt levels in specific regions of the image. Given the significant overlap between adjacent classes in our dataset, we were able to achieve an overall classification accuracy of 64% and a one-off accuracy of 96% on our holdout test set. Our model outperformed DenseNet121 in most metrics, and provided comparable performance to a vision transformer (ViT) while having fewer parameters overall, less complexity (useful for edge implementations), and some interpretability. Furthermore, we were able to show that our model outperformed expert human annotators by predicting more consistent and accurate wilt levels when considering single-image re-annotation. The results show that our proposed methodology can be a useful approach in detecting drought stress in soybean fields to facilitate efficient crop management and aid selection of drought-resilient varieties.

AgricultureVol. 15(6)
Agricultural Research Service (US), North Carolina State University (US)
U.S. Department of Agriculture
Openalex Percentile: Top 97%
Leaf Properties and Growth Measurement
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