The Role of Computer Vision in Automating Defect Detection in Manufacturing
Automating manufacturing problem-solving is a top priority for contemporary enterprises. This area benefits from computer vision. Our new bug-finding approach employs "CNN-based Feature Extraction," "RNN-based Temporal Analysis," and "Object Detection and Real-time Monitoring" to correct prior methods. Our technique begins with CNN feature extraction. It helps the system discover minor features in object images. The next step is "RNN-based Temporal Analysis," which helps the system detect changing faults over time, an issue that is often ignored by traditional systems. "Object Detection and Real-time Monitoring" improves upon previous methods of fault detection by allowing for rapid reactions to faults and a decrease in the manufacturing of defective goods. We tested the suggested strategy against more conventional methods using a well annotated dataset. In comparison to more conventional approaches, ours achieves higher precision, accuracy, and F1 score. While "CNN-based Feature Extraction" demonstrated competitive results, especially in terms of accuracy, "RNN-based Temporal Analysis" stood out by doing very well in situations when flaws grow dynamically. Finally, by overcoming the shortcomings of conventional approaches, the suggested technique provides a game-changing strategy for defect identification. It is the best option for manufacturers looking to improve quality control and optimize production processes since it can adapt to dynamic and complicated errors, responds in real-time, and has extensive feature extraction capabilities.
Authors
- G Vijayalakshmi.
- S. Arul Antran Vijay (ORCID: https://orcid.org/0000-0002-5543-7547)
- Santosh Kumar (ORCID: https://orcid.org/0000-0002-9273-0291)
- Prateek Garg (ORCID: https://orcid.org/0000-0002-6654-7004)
- Shankar Prasd S
- Jagmeet Sohal
Institutions
- Jain University (IN)
- Shri Venkateshwara University (IN)
- Karpagam Academy of Higher Education (IN)
- Chitkara University (IN)
Publication Details
- Published
- 2024-12-13
- DOI
- https://doi.org/10.1109/ictbig64922.2024.10911417
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 0.00