The MicroLED Revolution: Advancing Technology Through Metrology and Inspection

Abstract The variable quality of microLED wafers, especially in wavelength and brightness, presents a major challenge for the industry, and high‐throughput EL testing could be the solution.

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Publication Details

Journal
Information Display
Published
2025-03-01
DOI
https://doi.org/10.1002/msid.1565
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
0.00
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article

The MicroLED Revolution: Advancing Technology Through Metrology and Inspection

Ian Hendy, Tali Hurvitz, Noam Shapiro
Information Display
GaN-based semiconductor devices and materials
article

The MicroLED Revolution: Advancing Technology Through Metrology and Inspection

Ian Hendy, Tali Hurvitz, Noam Shapiro
article en

Abstract

Abstract The variable quality of microLED wafers, especially in wavelength and brightness, presents a major challenge for the industry, and high‐throughput EL testing could be the solution.

Information DisplayVol. 41(2)
Openalex Percentile: Top 97%
GaN-based semiconductor devices and materials
DOIOpen Access PDFOpenAlex
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The MicroLED Revolution: Advancing Technology Through Metrology and Inspection — Ian Hendy, Tali Hurvitz, et al. · Information Display (2025) | TGRS Research Map | TGRS