Unveiling the Nanoscale Dielectric Gap and Its Influence on Ferroelectric Polarization Switching in Scanning Probe Microscopy (Adv. Funct. Mater. 11/2025)

Ferroelectric Polarization Switching Scanning probe microscopy of ferroelectric materials faces challenges in accurately measuring coercive voltages due to the dielectric gap between the probe tip and sample surface. In article number 2406944, Lane W. Martin, Seungbum Hong, and co-workers reveal how different dielectric media in this gap significantly influence measurement outcomes. Using water as a high-permittivity medium (ϵr = 79) enables more reliable measurements that closely match conventional capacitor-based studies, providing a pathway to accurate quantitative analysis of ferroelectric materials.

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Publication Details

Journal
Advanced Functional Materials
Published
2025-03-01
DOI
https://doi.org/10.1002/adfm.202570066
Primary Topic
Force Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
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Unveiling the Nanoscale Dielectric Gap and Its Influence on Ferroelectric Polarization Switching in Scanning Probe Microscopy (Adv. Funct. Mater. 11/2025)

Pravin Kavle, Seungbum Hong, Lane W. Martin, Seongmun Eom et al.
Advanced Functional Materials
Force Microscopy Techniques and Applications
article

Unveiling the Nanoscale Dielectric Gap and Its Influence on Ferroelectric Polarization Switching in Scanning Probe Microscopy (Adv. Funct. Mater. 11/2025)

Pravin Kavle, Seungbum Hong, Lane W. Martin, Seongmun Eom, Deokyoung Kang, Yeongyu Kim
article en

Abstract

Ferroelectric Polarization Switching Scanning probe microscopy of ferroelectric materials faces challenges in accurately measuring coercive voltages due to the dielectric gap between the probe tip and sample surface. In article number 2406944, Lane W. Martin, Seungbum Hong, and co-workers reveal how different dielectric media in this gap significantly influence measurement outcomes. Using water as a high-permittivity medium (ϵr = 79) enables more reliable measurements that closely match conventional capacitor-based studies, providing a pathway to accurate quantitative analysis of ferroelectric materials.

Advanced Functional MaterialsVol. 35(11)
Korea Advanced Institute of Science and Technology (KR), Rice University (US), University of California, Berkeley (US)
Affordable and clean energy
Openalex Percentile: Top 97%
Force Microscopy Techniques and Applications
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