Unveiling the Nanoscale Dielectric Gap and Its Influence on Ferroelectric Polarization Switching in Scanning Probe Microscopy (Adv. Funct. Mater. 11/2025)
Ferroelectric Polarization Switching Scanning probe microscopy of ferroelectric materials faces challenges in accurately measuring coercive voltages due to the dielectric gap between the probe tip and sample surface. In article number 2406944, Lane W. Martin, Seungbum Hong, and co-workers reveal how different dielectric media in this gap significantly influence measurement outcomes. Using water as a high-permittivity medium (ϵr = 79) enables more reliable measurements that closely match conventional capacitor-based studies, providing a pathway to accurate quantitative analysis of ferroelectric materials.
Authors
- Pravin Kavle (ORCID: https://orcid.org/0000-0002-4066-7905)
- Seungbum Hong (ORCID: https://orcid.org/0000-0002-2667-1983)
- Lane W. Martin (ORCID: https://orcid.org/0000-0003-1889-2513)
- Seongmun Eom (ORCID: https://orcid.org/0000-0003-2306-021X)
- Deokyoung Kang (ORCID: https://orcid.org/0000-0003-2220-9334)
- Yeongyu Kim
Institutions
- Korea Advanced Institute of Science and Technology (KR)
- Rice University (US)
- University of California, Berkeley (US)
Publication Details
- Journal
- Advanced Functional Materials
- Published
- 2025-03-01
- DOI
- https://doi.org/10.1002/adfm.202570066
- Primary Topic
- Force Microscopy Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00