A Random Angle Error Interference Eliminating Method for Grating Interferometry Measurement Based on Symmetry Littrow Structure

Abstract All linear motion will have random angle errors, which will lead to linear displacement detection result deviating from the true value. To solve this common problem in the field of optical precision measurement, this study proposes a symmetry Littrow grating interferometry measurement method (SLGIM). SLGIM uses high‐precision planar diffraction gratings and place them on both sides of the central main optical system to build two complementary measurement arms with equal optical paths. There is a common mode suppression relationship between the two measurement arms, so the measurement system can eliminate random angle error interference and improve the precision of linear displacement detection. The experiment results show that when the same random angle error interference is applied, compared with the traditional grating measurement system, the mean value of error decreases 25.8%, the standard deviation decreases 37.5%, and the range decreases 33.7%. The result after using the structure proposed achieves nanometer‐level measurement precision.

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Publication Details

Journal
Laser & Photonics Review
Published
2025-02-28
DOI
https://doi.org/10.1002/lpor.202401659
Citations
31
Primary Topic
Advanced Measurement and Metrology Techniques
Type
article
Field-Weighted Citation Impact
22.12

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article

A Random Angle Error Interference Eliminating Method for Grating Interferometry Measurement Based on Symmetry Littrow Structure

Weicheng Wang, Zhaowu Liu, Wenhao Li, Lin Liu et al.
31 citations
Laser & Photonics Review
Advanced Measurement and Metrology Techniques
22.12
article

A Random Angle Error Interference Eliminating Method for Grating Interferometry Measurement Based on Symmetry Littrow Structure

Weicheng Wang, Zhaowu Liu, Wenhao Li, Lin Liu, Yujia Sun, Wenyuan Zhou
article en
31 citations

Abstract

Abstract All linear motion will have random angle errors, which will lead to linear displacement detection result deviating from the true value. To solve this common problem in the field of optical precision measurement, this study proposes a symmetry Littrow grating interferometry measurement method (SLGIM). SLGIM uses high‐precision planar diffraction gratings and place them on both sides of the central main optical system to build two complementary measurement arms with equal optical paths. There is a common mode suppression relationship between the two measurement arms, so the measurement system can eliminate random angle error interference and improve the precision of linear displacement detection. The experiment results show that when the same random angle error interference is applied, compared with the traditional grating measurement system, the mean value of error decreases 25.8%, the standard deviation decreases 37.5%, and the range decreases 33.7%. The result after using the structure proposed achieves nanometer‐level measurement precision.

Laser & Photonics ReviewVol. 19(11)
Jilin University (CN), Chinese Academy of Sciences (CN), Changchun Institute of Optics, Fine Mechanics and Physics (CN), University of Chinese Academy of Sciences (CN)
National Natural Science Foundation of China
Openalex Percentile: Top 0%
Advanced Measurement and Metrology Techniques
22.12
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