In‐Situ Customized Printing and MEMS‐Based Mechanical Characterization of FIB‐CVD Free‐Standing Pt‐C Nanospring

Abstract Growing freestanding nanostructures of arbitrary lengths by focused‐ion‐beam (FIB) is difficult because prolonged exposure may cause FIB drift and thermal effects. Particularly, Pt has a slower growth rate compared to W or C, making the growth of longer Pt nanostructures via FIB chemical vapor deposition (FIB‐CVD) more challenging. Herein, a FIB‐CVD printing strategy is developed with the optimal deposition parameters, which has the capability to fabricate the 18‐µm‐long Pt‐C nanospring. Meanwhile, an automated in‐situ tensile testing system based on a micro‐electro‐mechanical system (MEMS) test platform is designed to evaluate the mechanical properties of the nanowire and nanospring fabricated with the same FIB‐CVD printing parameters. The tensile test results demonstrate that the presented printing method owns controllable and stable manufacture capability. Moreover, the spring coefficient of the nanospring is 5.97 N m −1 in the elastic range (0–16%), and the stretching stain is 28%, which is four times than that of the fabricated nanowire. In addition, during 2000 cycles fatigue and stability testing, the designed nanospring demonstrates high fatigue resistance and stability. This work provides a reliable FIB‐CVD printing manufactural strategy, which paves a new insight into nanomanufacturing technology and nanostrain engineering.

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Publication Details

Journal
Advanced Materials Technologies
Published
2025-03-02
DOI
https://doi.org/10.1002/admt.202401887
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
0.00

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article

In‐Situ Customized Printing and MEMS‐Based Mechanical Characterization of FIB‐CVD Free‐Standing Pt‐C Nanospring

Litao Sun, Zijian Gao, Kuibo Yin, Meng Nie et al.
2 links
Advanced Materials Technologies
Integrated Circuits and Semiconductor Failure Analysis
article

In‐Situ Customized Printing and MEMS‐Based Mechanical Characterization of FIB‐CVD Free‐Standing Pt‐C Nanospring

Litao Sun, Zijian Gao, Kuibo Yin, Meng Nie, Jingxian Zhong, Yuheng Huang, Binghui Li, Xiaoran Gong
article en

Abstract

Abstract Growing freestanding nanostructures of arbitrary lengths by focused‐ion‐beam (FIB) is difficult because prolonged exposure may cause FIB drift and thermal effects. Particularly, Pt has a slower growth rate compared to W or C, making the growth of longer Pt nanostructures via FIB chemical vapor deposition (FIB‐CVD) more challenging. Herein, a FIB‐CVD printing strategy is developed with the optimal deposition parameters, which has the capability to fabricate the 18‐µm‐long Pt‐C nanospring. Meanwhile, an automated in‐situ tensile testing system based on a micro‐electro‐mechanical system (MEMS) test platform is designed to evaluate the mechanical properties of the nanowire and nanospring fabricated with the same FIB‐CVD printing parameters. The tensile test results demonstrate that the presented printing method owns controllable and stable manufacture capability. Moreover, the spring coefficient of the nanospring is 5.97 N m −1 in the elastic range (0–16%), and the stretching stain is 28%, which is four times than that of the fabricated nanowire. In addition, during 2000 cycles fatigue and stability testing, the designed nanospring demonstrates high fatigue resistance and stability. This work provides a reliable FIB‐CVD printing manufactural strategy, which paves a new insight into nanomanufacturing technology and nanostrain engineering.

Advanced Materials Technologies
Southeast University (CN)
National Natural Science Foundation of China
Openalex Percentile: Top 97%
Integrated Circuits and Semiconductor Failure Analysis
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