Equivalent Electromagnetic Radiation Model of Chip Based on Near-Field Scanning for EMI Analysis in Ceramic SiP

With the continuous increase in system-in-package (SiP) integration and chip frequencies, electromagnetic interference (EMI) issues have become increasingly prominent. To perform EMI simulation of SiP, it is essential to first establish the radiation model of chip. this study proposes a method for developing an equivalent radiation model for SiP-integrated chips using near-field scanning techniques. By considering the packaging configuration of the chip within SiP, the equation between the electric dipole and magnetic dipole arrays and the magnetic field on the scanning plane is established. The Tikhonov regularization method is then employed to solve this equation, yielding the equivalent dipole model. Application examples demonstrate that the proposed reconstruction method can achieve satisfactory accuracy, and the accuracy of the proposed equivalent model is also validated using the Frequency Selective Voltage (FSV) method. Based on this model, further analysis of EMI within SiP is conducted, and the results demonstrate that the model has significant application value in accurately analyzing and evaluating EMI within SiP.