Heterogenous Package Stress Modeling Using Polynomial Deep Regression with Latin Hypercube Sampling and Factorial Analysis
High stress occurs when 3D heterogeneous IC packages are subjected to thermal cycling at extreme temperatures. Testing and production require simplified but accurate stress prediction tools. This allows engineers with no Finite Element Analysis (FEA) background to perform fast and efficient routine package stresses check for testing/production purpose. To this end, we develop an AI/ ML based stress predictor for heterogeneous packages.
Authors
- Kart Leong Lim
- Lin Ji
Institutions
- Agency for Science, Technology and Research (SG)
- Institute of Microelectronics (SG)
Publication Details
- Published
- 2024-12-03
- DOI
- https://doi.org/10.1109/eptc62800.2024.10909975
- Primary Topic
- Nuclear and radioactivity studies
- Type
- article
- Field-Weighted Citation Impact
- 0.00