Lifetime Modelling Strategy for Multilayer Ceramic Capacitors by Halt Test

The work lifetime of Multilayer Ceramic Capacitors (MLCC) is a concern for EIA 0201 and smaller form-factor capacitors with challenging high capacitance requirements from high performance computing companies. As the dielectric layer becomes thinner, any minor defect may cause an electric short in field application and reduce product lifetime. Highly Accelerated Life Test (HALT) is a widely accepted methodology by MLCC manufacturers on MLCC development for lifetime assessment. In this project, HALT test was setup for direct comparisons among suppliers and to understand the variation of manufacturing process as well as physical failure mechanism differences.