Process Development of Twin 2 Die Stack Modules for Deep Learning Hardware Accelerator
The demand of more computational power drives the need of having more and more memory to process the ever-increasing data amount. As such, there is a need to pack more memory dies on the same modules. In conventional approaches, memory dies are stacked on top of each other and communicated either using bonding wires or through micro-bumps. The interconnects through the use of TSV/micro-bumps are prefer as it offered better performance in terms of shorter communication length, lesser electrical parasites and the opportunity of heat transfer by attaching heat spreader on top of the die. In this manuscript, we are proposing putting two sets of two die stack with micro-bumps on the same interposer to enable a low-profile package that can be housed in application whereby the z-spacing is limited.
Authors
- Sharon Lim Pei Siang
- Xiangyu Wang (ORCID: https://orcid.org/0000-0003-1155-639X)
- Ser Choong Chong
- Ling Xie
Institutions
- Agency for Science, Technology and Research (SG)
- Institute of Microelectronics (SG)
Publication Details
- Published
- 2024-12-03
- DOI
- https://doi.org/10.1109/eptc62800.2024.10909777
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 0.00