A Versatile Side Entry Laser System for Scanning Transmission Electron Microscopy (Adv. Mater. Technol. 5/2025)
Scanning Transmission Electron Microscopy In article number 2401208, Ondrej Dyck and co-workers present a laser system that allows laser irradiation to a sample as well as ablation of a nearby target to deposit material onto the sample. This work represents the first steps toward integrating synthesis processes with electron beam induced sample modification.
Authors
- Ondrej Dyck (ORCID: https://orcid.org/0000-0001-8200-9874)
- Kai Xiao (ORCID: https://orcid.org/0000-0002-0402-8276)
- Olugbenga Olunloyo
- Stephen Jesse (ORCID: https://orcid.org/0000-0002-1168-8483)
- Andrew R. Lupini (ORCID: https://orcid.org/0000-0002-1874-7925)
- Benjamin Wolf
- Thomas M. Moore (ORCID: https://orcid.org/0000-0002-0899-5706)
Institutions
- Oak Ridge National Laboratory (US)
- University of Tennessee at Knoxville (US)
Publication Details
- Journal
- Advanced Materials Technologies
- Published
- 2025-03-01
- DOI
- https://doi.org/10.1002/admt.202570025
- Citations
- 1
- Primary Topic
- Electron and X-Ray Spectroscopy Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.66