Single‐Crystalline β‐Ga <sub>2</sub> O <sub>3</sub> Homoepitaxy on a Near Van der Waals Surface of (100) Substrate
Gallium oxide (Ga₂O₃) is a promising wide-bandgap semiconductor for power devices, offering high breakdown voltage and low on-resistance. Among its polymorphs, β-Ga₂O₃ stands out due to the availability of high-quality, large-area single-crystalline substrates, particularly on the (100) surface, grown via melt-based bulk crystal growth. However, the low surface energy of β-Ga₂O₃ (100), akin to 2D materials, presents challenges in homoepitaxy, including poor nucleation and twin formation, which hinder its practical application. This study demonstrates the successful homoepitaxial growth of single-crystalline β-Ga₂O₃ on (100) substrates using a van der Waals epitaxial approach. By introducing an excess surfactant metal in metal-rich conditions at high temperature, a growth regime approximate thermal equilibrium is achieved, enhancing adatom diffusion and suppressing metastable twin phases. This adjustment enables the formation of well-ordered, single-crystalline nuclei and lateral stitching in a half-layer-by-half-layer growth mode, similar to 2D material growth. The result is twin-free, atomically flat, single-crystal thin films on on-axis β-Ga₂O₃ (100) substrates. These findings significantly improve the crystalline quality of epitaxial β-Ga₂O₃ on (100) substrates, demonstrating their potential for scalable production of high-performance, cost-effective β-Ga₂O₃-based power devices, and advancing their feasibility for industrial applications.
Authors
- Junwei Cao
- Yaqing Ma (ORCID: https://orcid.org/0009-0001-4766-2592)
- Tong Min Jiang (ORCID: https://orcid.org/0000-0002-9688-7886)
- Xiaoqing Huo
- Zhiqing Yang (ORCID: https://orcid.org/0000-0003-2017-6583)
- Hao Wang (ORCID: https://orcid.org/0000-0002-5379-1120)
- Wei Kong (ORCID: https://orcid.org/0000-0002-7965-4407)
- Shengnan Zhang (ORCID: https://orcid.org/0000-0003-1051-7196)
- Huaze Zhu (ORCID: https://orcid.org/0009-0009-0115-6748)
- Junshuai Li (ORCID: https://orcid.org/0000-0003-3670-8353)
- Xiang Xu (ORCID: https://orcid.org/0009-0009-9282-2098)
Institutions
- China Electronics Technology Group Corporation (CN)
- Westlake University (CN)
- Ji Hua Laboratory (CN)
- Zhejiang University (CN)
Publication Details
- Journal
- Advanced Science
- Published
- 2025-03-08
- DOI
- https://doi.org/10.1002/advs.202417436
- Citations
- 4
- Primary Topic
- Ga2O3 and related materials
- Type
- article
- Field-Weighted Citation Impact
- 1.71