Model-Based Systems Engineering of the Event-Driven Industrial Internet of Things
The Industrial Internet of Things (IIoT) is characterized by a multitude of standards, protocols, and tools. Moreover, the convergence of Information Technology (IT) and Operational Technology (OT) brings new architectural styles, e.g., event-driven communication, that are easier to scale and integrate IIoT devices. Architects need extensive expertise to manage the complex task of designing systems that encompass hardware, software, information, communication, and users. Proven approaches such as Model-Based Systems Engineering (MBSE) can simplify the design of IIoT systems by offering abstractions through system models and views. In this paper, we introduce an MBSE approach grounded in Systems Modeling Language (SysML) 2.0. Our method involves defining metadata tailored to event-driven IIoT systems. System designers can generate tagged model instances that undergo automatic validation against system requirements, such as asynchronous messaging, authentication, and health checks. Following validation, these models are utilized by an artifact generator to produce code, test cases, or documentation. Our approach is designed for reusability, and we provide tool support to streamline the implementation of requirements checking for emerging standards and guidelines. This enhances the flexibility and efficiency of IIoT system design, ensuring compliance with diverse and evolving industry requirements.
Authors
- Amirali Amiri (ORCID: https://orcid.org/0000-0002-6915-6711)
- Gernot Steindl (ORCID: https://orcid.org/0000-0002-9035-9206)
- Max Thoma (ORCID: https://orcid.org/0009-0000-0142-6394)
- Wolfgang Kästner (ORCID: https://orcid.org/0000-0001-5420-404X)
- Christoph Klaassen (ORCID: https://orcid.org/0000-0001-8354-2574)
Institutions
- TU Wien (AT)
Publication Details
- Published
- 2024-11-03
- DOI
- https://doi.org/10.1109/iecon55916.2024.10905855
- Primary Topic
- Business Process Modeling and Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00