Advances in Hardware and Measurement Techniques to Enable Better Millimeter-Wave Device Characterization and Modeling

The advent of commercially-relevant applications above 100 GHz is generating more requests from foundries and users for improved accuracy of RF measurements performed at these frequencies. Mm-wave extender-based VNA architectures have become the common approach to characterize the small signal and (first order) large signal behavior of devices and subsystems operating into the sub-THz range. This article presents a critical insight into the advances in, and capabilities of the hardware, and measurement techniques that can employed, to make the most of the hardware, in the characterization and modelling of mm-wave devices.