From S-Parameters to Wideband Modulation Stimulus-Response for Sub-THz Component Testing
This paper proposes an extensive tour of the evolution over 5 decades of the Vector Network Analyzers. The stimulus-response essential concept has been pushed to ultra-wideband modulated test signals and up to sub-THz frequencies. Advanced and very important component test metrics like modulation distortion are measured in a vector match corrected environment. The importance of modern vector Network Analyzers in new technologies development is demonstrated.
Authors
- Johan Ericsson
- Suren Singh (ORCID: https://orcid.org/0000-0002-2409-8722)
- Nizar Messaoudi (ORCID: https://orcid.org/0000-0002-7597-6820)
- Sam Kusano
- Joel P. Dunsmore (ORCID: https://orcid.org/0000-0002-0534-5134)
- Jean-Pierre Teyssier (ORCID: https://orcid.org/0000-0001-7930-1567)
Institutions
- Keysight Technologies (United States) (US)
Publication Details
- Journal
- IEEE Microwave Magazine
- Published
- 2025-03-05
- DOI
- https://doi.org/10.1109/mmm.2024.3524870
- Primary Topic
- Radio Frequency Integrated Circuit Design
- Type
- article
- Field-Weighted Citation Impact
- 0.00