From S-Parameters to Wideband Modulation Stimulus-Response for Sub-THz Component Testing

This paper proposes an extensive tour of the evolution over 5 decades of the Vector Network Analyzers. The stimulus-response essential concept has been pushed to ultra-wideband modulated test signals and up to sub-THz frequencies. Advanced and very important component test metrics like modulation distortion are measured in a vector match corrected environment. The importance of modern vector Network Analyzers in new technologies development is demonstrated.

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Publication Details

Journal
IEEE Microwave Magazine
Published
2025-03-05
DOI
https://doi.org/10.1109/mmm.2024.3524870
Primary Topic
Radio Frequency Integrated Circuit Design
Type
article
Field-Weighted Citation Impact
0.00
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From S-Parameters to Wideband Modulation Stimulus-Response for Sub-THz Component Testing

Johan Ericsson, Suren Singh, Nizar Messaoudi, Sam Kusano et al.
IEEE Microwave Magazine
Radio Frequency Integrated Circuit Design
article

From S-Parameters to Wideband Modulation Stimulus-Response for Sub-THz Component Testing

Johan Ericsson, Suren Singh, Nizar Messaoudi, Sam Kusano, Joel P. Dunsmore, Jean-Pierre Teyssier
article en

Abstract

This paper proposes an extensive tour of the evolution over 5 decades of the Vector Network Analyzers. The stimulus-response essential concept has been pushed to ultra-wideband modulated test signals and up to sub-THz frequencies. Advanced and very important component test metrics like modulation distortion are measured in a vector match corrected environment. The importance of modern vector Network Analyzers in new technologies development is demonstrated.

IEEE Microwave MagazineVol. 26(4)
Keysight Technologies (United States) (US)
Openalex Percentile: Top 97%
Radio Frequency Integrated Circuit Design
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