Shorter pre-data acquisition time for magnetic particle imaging using AC susceptometry

Magnetic nanoparticle imaging (MPI) with a detection coil array can be used to estimate the position and quantity of magnetic nanoparticles (MNPs) via inverse problem analysis. In MPI studies, a system matrix is experimentally acquired for inverse problem analysis. However, a long acquisition time causes large temperature fluctuations in the excitation coil and electric circuit, and drift noise is present in the system matrix. In this study, we propose the generation of a system matrix by fitting a simulated system matrix using AC susceptometry to fewer experimental measurement points. Even when an inverse problem analysis was performed using a system matrix fitted with 1/100th the number of measurement data, the accuracy was higher than that obtained using an experimental matrix. This contributed to shortening the acquisition time.