Effect of Neutron Irradiation on the Characteristics of SiC and Si Detectors

The characteristics of detectors based on silicon (Si) and silicon carbide (SiC), which were irradiated with integral neutron fluxes Φ = 5.1 × 1013, 5.4 × 1014, and 3.4 × 1015 neutrons/cm2 (1 MeV/Si), are presented. It was found that the conductivity of the sensitive region becomes close to its own for all irradiated samples. Using alfa particles, the authors found that, for Si detectors irradiated with a minimum flux of 5.1 × 1013 neutrons/cm2, the charge collection efficiency (η) does not exceed 1.5%. For SiC detectors irradiated with a similar flux, η = 96%, and η decreased to 70 and 1.5%, respectively, when irradiated with average and maximum fluxes. Thus, it is shown that the deterioration in the performance of SiC detectors occurs at significantly higher dose loads than when using Si devices.

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Publication Details

Journal
Instruments and Experimental Techniques
Published
2024-12-01
DOI
https://doi.org/10.1134/s0020441224702014
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
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article

Effect of Neutron Irradiation on the Characteristics of SiC and Si Detectors

S. Rozov, M. S. Dovbnenko, E. A. Streletskaya, Bohumír Zaťko et al.
1 links
Instruments and Experimental Techniques
Silicon Carbide Semiconductor Technologies
article

Effect of Neutron Irradiation on the Characteristics of SiC and Si Detectors

S. Rozov, M. S. Dovbnenko, E. A. Streletskaya, Bohumír Zaťko, Yu. B. Gurov, B. A. Chernyshev, S. A. Evseev, Yu. A. Kopylov, L. Hrubčín, N. I. Zamyatin
article en

Abstract

The characteristics of detectors based on silicon (Si) and silicon carbide (SiC), which were irradiated with integral neutron fluxes Φ = 5.1 × 1013, 5.4 × 1014, and 3.4 × 1015 neutrons/cm2 (1 MeV/Si), are presented. It was found that the conductivity of the sensitive region becomes close to its own for all irradiated samples. Using alfa particles, the authors found that, for Si detectors irradiated with a minimum flux of 5.1 × 1013 neutrons/cm2, the charge collection efficiency (η) does not exceed 1.5%. For SiC detectors irradiated with a similar flux, η = 96%, and η decreased to 70 and 1.5%, respectively, when irradiated with average and maximum fluxes. Thus, it is shown that the deterioration in the performance of SiC detectors occurs at significantly higher dose loads than when using Si devices.

Instruments and Experimental TechniquesVol. 67(6)
Institute of Chemistry of the Slovak Academy of Sciences (SK), Slovak Academy of Sciences (SK), Joint Institute for Nuclear Research (RU), Institute of History of the Slovak Academy of Sciences (SK), National Research Nuclear University MEPhI (RU)
Openalex Percentile: Top 74%
Silicon Carbide Semiconductor Technologies
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