Sinusoidal spiral-bent crystal for high-resolution X-ray spectrometer: theory and implementation

X-ray diagnosis technology predicated on crystal diffraction is a vital modality for garnering key parameters within the scope of X-ray spectroscopy diagnosis. Conventional spectrometers, such as cylindrically bent crystal, spherically bent crystal, and other structures, suffer from a resolution-bandwidth trade-off, thus limiting the uses of the device. A spectrometer design method based on the sinusoidal spiral bent crystal dispersion module is proposed in this paper to correct this serious aberration in an extended energy range. This newly developed crystal structure is empowered to meet the prerequisites for attaining impeccable imaging of a broadening source with respect to each specific wavelength. We introduced an integrated spectrometer scheme including this sinusoidal spiral-bent crystal that functions as the diffraction and focusing element. Our scheme also includes a CMOS photon detector that is enlisted for the detection of spectra originating from a Cu target X-ray tube. A series of meticulous simulations and experiments demonstrate that this spectrometer provides a very high spectral resolution of 2950. Moreover, it also indicates that the spatial resolution exceeds 20µm, showing a remarkable improvement compared to previous similar spectrometers.