What's in a Name? “ESCA” or “XPS”? A Discussion of Comments Made by Kai Siegbahn More Than Four Decades Ago Regarding the Name of the Technique

ABSTRACT In an interview in 1982, which was 1 year after he shared the Nobel Prize, Kai Siegbahn was asked about his opinion regarding the name of the technique he had developed. Siegbahn had named it “electron spectroscopy for chemical analysis” (ESCA), but the community was choosing to call it “X‐ray photoelectron spectroscopy” (XPS). Now, more than 40 years later, 20 XPS experts have given their opinions on Siegbahn's response and the name of the technique. Some of these participants have been doing XPS for many years and have provided a historical perspective on this issue. While there is no call in these comments for the community to return to “ESCA”—“XPS” is regarded as a more than an adequate name, and insisting on a name change at this point in time would probably only create confusion. However, some of the participants of this study still consider “ESCA” to be an acceptable way to refer to the technique, especially when it is used in a chemical context.

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Publication Details

Journal
Surface and Interface Analysis
Published
2025-03-04
DOI
https://doi.org/10.1002/sia.7392
Citations
4
Primary Topic
Electron and X-Ray Spectroscopy Techniques
Type
article
Field-Weighted Citation Impact
2.64

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article

What's in a Name? “ESCA” or “XPS”? A Discussion of Comments Made by Kai Siegbahn More Than Four Decades Ago Regarding the Name of the Technique

Joshua W. Pinder, Jeff Terry, L. Kövér, William M. Skinner et al.
4 citations
Surface and Interface Analysis
Electron and X-Ray Spectroscopy Techniques
2.64
article

What's in a Name? “ESCA” or “XPS”? A Discussion of Comments Made by Kai Siegbahn More Than Four Decades Ago Regarding the Name of the Technique

Joshua W. Pinder, Jeff Terry, L. Kövér, William M. Skinner, Matthew R. Linford, David G. Castner, David Morgan, John T. Grant, Grzegorz Greczyński, A.E. Hughés, George H. Major, C. J. Powell, Peter M. A. Sherwood, Sarah L. Harmer, J. E. Castle, Christopher D. Easton, Mark A. Isaacs, Kara J. Stowers, Donald R. Baer, Mark C. Biesinger, Braxton Kulbacki
article en
4 citations

Abstract

ABSTRACT In an interview in 1982, which was 1 year after he shared the Nobel Prize, Kai Siegbahn was asked about his opinion regarding the name of the technique he had developed. Siegbahn had named it “electron spectroscopy for chemical analysis” (ESCA), but the community was choosing to call it “X‐ray photoelectron spectroscopy” (XPS). Now, more than 40 years later, 20 XPS experts have given their opinions on Siegbahn's response and the name of the technique. Some of these participants have been doing XPS for many years and have provided a historical perspective on this issue. While there is no call in these comments for the community to return to “ESCA”—“XPS” is regarded as a more than an adequate name, and insisting on a name change at this point in time would probably only create confusion. However, some of the participants of this study still consider “ESCA” to be an acceptable way to refer to the technique, especially when it is used in a chemical context.

Surface and Interface AnalysisVol. 57(5)
Brigham Young University (US), Linköping University (SE), Western University (CA), Commonwealth Scientific and Industrial Research Organisation (AU), National Institute of Standards and Technology (US), Pacific Northwest National Laboratory (US), Deakin University (AU), Flinders University (AU), University of South Australia (AU), Illinois Institute of Technology (US), HUN-REN Institute for Nuclear Research (HU), University of Washington (US), Clearwater Christian College (US), University of Surrey (GB), Research Complex at Harwell (GB), Institute of Biomedical Problems (RU), ARC Centre of Excellence for Enabling Eco-Efficient Beneficiation of Minerals (AU), Process Instruments (United States) (US), Thinfilm (Sweden) (SE), Australian Resources Research Centre (AU), Clearwater Group (United States) (US), Material Measurement Laboratory (US), CSIRO Manufacturing (AU), University College London (GB), Texas Instruments (United States) (US), Cardiff University (GB)
Engineering and Physical Sciences Research Council
Openalex Percentile: Top 11%
Electron and X-Ray Spectroscopy Techniques
2.64
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