Study of the GdK<sub>2</sub>Nb<sub>5</sub>O15 thin film by scanning probe microscopy and X-ray diffraction methods
Ferroelectric thin films of GdK 2 Nb 5 O[Formula: see text] (GKN) are considered one of the new promising materials for computer memory systems. The electric potential of the GKN surface in the near vicinity of the burnt-in Pt electrode was measured using the Kelvin probe force microscopy (KPFM) method. The results are compared with the description of the metal-ferroelectric contact proposed by Pentile and Alexe (2005). Analysis of the contributions to the electric potential suggests a more complex charge distribution than suggested by the simple model.
Authors
- Y. Gagou (ORCID: https://orcid.org/0000-0001-6196-8849)
- I. P. Raevski (ORCID: https://orcid.org/0000-0003-0132-9150)
- О. А. Бунина
- M. A. Bunin (ORCID: https://orcid.org/0009-0000-4910-1628)
- M. El Marssi (ORCID: https://orcid.org/0000-0003-4680-4912)
- Yu. A. Kuprina
- S. M. Tarkhanyan
- V. Yu. Kochegarova
Institutions
- Southern Federal University (RU)
- Université de Picardie Jules Verne (FR)
Publication Details
- Journal
- Journal of Advanced Dielectrics
- Published
- 2025-03-06
- DOI
- https://doi.org/10.1142/s2010135x25500079
- Primary Topic
- Ferroelectric and Piezoelectric Materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00