Ferroelectric Tunable Nonvolatile Polarization Detection Based on 2H α-In<sub>2</sub>Se<sub>3</sub>
The development of polarization photodetectors utilizing two-dimensional materials holds significant promise due to their distinctive properties and potential for high integration. However, a major limitation of most current polarization photodetectors is their lack of polarization tuning capability, which restricts the versatility of individual devices. In this study, a nonvolatile ferroelectric tunable polarization photodetector is explored based on 2H α-In<sub>2</sub>Se<sub>3</sub>. The ferroelectric semiconductor field-effect transistor (FeS-FET) based on 2H α-In<sub>2</sub>Se<sub>3</sub> were fabricated, demonstrating an on/off ratio of 10<sup>3</sup>. Ferroelectric modulation photoelectric response was explored under 650 nm illumination, the device achieves a maximum optical responsivity of 75 A/W, with a detectivity of 1.46 × 10<sup>10</sup> jones. Notably, in the context of polarized light detection, the device's polarization sensitivity experiences significant modulation due to ferroelectric polarization switching. The dichroic ratios can be tuned to 1.74 and 3 for polarization down and up states, respectively. Moreover, by adjusting the degree of ferroelectric polarization switching, the dichroic ratio can be linearly tuned. The polarization up state can continuously enhance the dichroic ratio in the range of 2.71-3.11, while the polarization down state can continuously weaken the dichroic ratio in the range of 2.54-2.06. This research not only advances the understanding of 2H α-In<sub>2</sub>Se<sub>3</sub> in polarization detection but also introduces a nonvolatile ferroelectric modulation approach for tunable polarization detection.
Authors
- Cai Luo (ORCID: https://orcid.org/0009-0000-6540-9606)
- Wugang Liao (ORCID: https://orcid.org/0000-0002-1461-2222)
- Tengzhang Liu
- Qinghu Bai (ORCID: https://orcid.org/0000-0001-9214-1457)
- Baoli Liu (ORCID: https://orcid.org/0000-0002-0828-5093)
- Yang Guo (ORCID: https://orcid.org/0000-0001-8975-9387)
- Han Chen (ORCID: https://orcid.org/0000-0002-8970-5941)
- Lin Wang (ORCID: https://orcid.org/0000-0003-3430-7345)
- Zhi‐Quan Liu (ORCID: https://orcid.org/0000-0001-7097-8977)
- Changzhi Gu (ORCID: https://orcid.org/0000-0002-2689-2807)
- Xin Huang
- Haifang Yang
- Zhuoxuan Han
- Baogang Quan (ORCID: https://orcid.org/0000-0002-9353-6044)
- Weiying Zheng (ORCID: https://orcid.org/0000-0003-2821-1478)
Institutions
- Shenzhen University (CN)
- Shanghai Jiao Tong University (CN)
- Chinese Academy of Sciences (CN)
- Physical Sciences (United States) (US)
- Songshan Lake Materials Laboratory (CN)
- FZU ‒ Institute of Physics of the Academy of Sciences of the Czech Republic (CZ)
- University of Chinese Academy of Sciences (CN)
- Center for Excellence in Education (US)
Publication Details
- Journal
- ACS Applied Materials & Interfaces
- Published
- 2025-03-06
- DOI
- https://doi.org/10.1021/acsami.4c21713
- Citations
- 1
- Primary Topic
- Optical Polarization and Ellipsometry
- Type
- article
- Field-Weighted Citation Impact
- 0.67
Funders
- Science and Technology Foundation of Shenzhen City
- National Natural Science Foundation of China
- Shenzhen University
- Basic and Applied Basic Research Foundation of Guangdong Province