Topological surface state electron transport in patterned SnTe films

We synthesize topological crystal insulator SnTe thin films with different patterns of polygon holes, polygon networks, and semiregular arrays of square holes. Magnetoconductivity on the patterned films shows that despite the presence of the holes, weak antilocalization (WAL) effects are present at all measured temperatures, from 2 to 10 K. Via fitting with the Hikami-Larkin-Nagaoka equation, a larger number of WAL channels at all temperatures in the patterned films compared to a flat continuous film was observed, suggesting the suppression of bulk conduction by the presence of the patterns. In the films patterned with square holes, the coherence length is limited to 200 nm at low temperatures (2 to 5 K), consistent with diffuse scattering of topologically protected surface state carriers to the hole boundaries. Our findings reveal opportunities to tune topological properties with nanopatterning.

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Publication Details

Journal
Physical Review Materials
Published
2025-03-06
DOI
https://doi.org/10.1103/physrevmaterials.9.034201
Primary Topic
Topological Materials and Phenomena
Type
article
Field-Weighted Citation Impact
0.00

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article

Topological surface state electron transport in patterned SnTe films

Stephen D. Albright, F. J. Walker, Dung Vu, Yeong Jae Shin et al.
Physical Review Materials
Topological Materials and Phenomena
article

Topological surface state electron transport in patterned SnTe films

Stephen D. Albright, F. J. Walker, Dung Vu, Yeong Jae Shin, Shu-hang Pan, Charles H. Ahn
article en

Abstract

We synthesize topological crystal insulator SnTe thin films with different patterns of polygon holes, polygon networks, and semiregular arrays of square holes. Magnetoconductivity on the patterned films shows that despite the presence of the holes, weak antilocalization (WAL) effects are present at all measured temperatures, from 2 to 10 K. Via fitting with the Hikami-Larkin-Nagaoka equation, a larger number of WAL channels at all temperatures in the patterned films compared to a flat continuous film was observed, suggesting the suppression of bulk conduction by the presence of the patterns. In the films patterned with square holes, the coherence length is limited to 200 nm at low temperatures (2 to 5 K), consistent with diffuse scattering of topologically protected surface state carriers to the hole boundaries. Our findings reveal opportunities to tune topological properties with nanopatterning.

Physical Review MaterialsVol. 9(3)
Yale University (US)
Air Force Office of Scientific Research
Openalex Percentile: Top 97%
Topological Materials and Phenomena
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Topological surface state electron transport in patterned SnTe films — Stephen D. Albright, F. J. Walker, et al. · Physical Review Materials (2025) | TGRS Research Map | TGRS