WSe₂ and CuO Blend-Based Broadband Photodetector With Poly-TPD (HTL) and PCBM (ETL)

This article reports an Al/[6,6]-phenyl-C 61-butyric acid methyl ester (PCBM)/WSe2: CuO/Poly-TPD/ITO-coated polyethylene terephthalate (PET) structure-based broadband photodetector. The fabricated device incorporates Poly-TPD and PCBM as a hole transport layer (HTL) and electron transport layer (ETL), while the WSe2 and CuO blend is sandwiched in between HTL and ETL to work as an active layer. All the solutions were prepared by the dispersion methodology and were deposited through a spin coater. Finally, electrodes (Al contacts) were deposited on PCBM (ETL) with the thermal evaporation technique. The suggested photodetector exhibits maximum responsivity <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${R}_{S}$ </tex-math></inline-formula>(A/W) of 14.32, 11.43, and 2.1 A/W at 300 nm (UV), 450 nm (visible), and 1200 nm [near infrared range (NIR)] at -0.75-V bias. The incorporation of ETL and HTL shows the promising photograph response of the device and paves the way for the optoelectronic application of the proposed photodetector.

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Publication Details

Journal
IEEE Transactions on Electron Devices
Published
2025-03-06
DOI
https://doi.org/10.1109/ted.2025.3545607
Citations
3
Primary Topic
Chalcogenide Semiconductor Thin Films
Type
article
Field-Weighted Citation Impact
2.19
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article

WSe₂ and CuO Blend-Based Broadband Photodetector With Poly-TPD (HTL) and PCBM (ETL)

Shweta Tripathi, Sunny Sharma, Tulika Bajpai
3 citations
IEEE Transactions on Electron Devices
Chalcogenide Semiconductor Thin Films
2.19
article

WSe₂ and CuO Blend-Based Broadband Photodetector With Poly-TPD (HTL) and PCBM (ETL)

Shweta Tripathi, Sunny Sharma, Tulika Bajpai
article en
3 citations

Abstract

This article reports an Al/[6,6]-phenyl-C 61-butyric acid methyl ester (PCBM)/WSe2: CuO/Poly-TPD/ITO-coated polyethylene terephthalate (PET) structure-based broadband photodetector. The fabricated device incorporates Poly-TPD and PCBM as a hole transport layer (HTL) and electron transport layer (ETL), while the WSe2 and CuO blend is sandwiched in between HTL and ETL to work as an active layer. All the solutions were prepared by the dispersion methodology and were deposited through a spin coater. Finally, electrodes (Al contacts) were deposited on PCBM (ETL) with the thermal evaporation technique. The suggested photodetector exhibits maximum responsivity <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${R}_{S}$ </tex-math></inline-formula>(A/W) of 14.32, 11.43, and 2.1 A/W at 300 nm (UV), 450 nm (visible), and 1200 nm [near infrared range (NIR)] at -0.75-V bias. The incorporation of ETL and HTL shows the promising photograph response of the device and paves the way for the optoelectronic application of the proposed photodetector.

IEEE Transactions on Electron DevicesVol. 72(4)
Motilal Nehru National Institute of Technology (IN), Indian Institute of Information Technology Allahabad (IN)
Openalex Percentile: Top 13%
Chalcogenide Semiconductor Thin Films
2.19
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