A 300MB SRAM, 20Tb/s Bandwidth Scalable Heterogenous 2.5D System Inferencing Simultaneous Streams Across 20 Chiplets with Workload-Dependent Configurations
Disaggregating large systems has shown multifold advantages especially with current application trends prompting a shift towards chiplet-based architectures [1]–[3]. To meet increasing computing demands, 2.5D systems should allow greater interoperability across advanced technology nodes from multiple foundries, higher system memory capacity, higher 10 counts and scalable interconnect pitches. To further address the escalating memory capacity demands and mitigate the bandwidth bottleneck prevalent in AI applications, chiplet systems should be capable of workload-tailored configurations at assembly time. This adaptability enables optimal resource allocation and facilitates processing of voluminous datasets and complex AI computations.
Authors
- Sriram K. Muthukumar
- Brando Perez Esparza
- James Greensky
- Saransh Chhabra
- Esdras Juárez Hernández
- Anuradha Srinivasan
- Tanay Karnik (ORCID: https://orcid.org/0000-0003-0072-1492)
- Satish Yada
- Jaykant Timbadiya
- Shawna M. Liff
- Dan Lake (ORCID: https://orcid.org/0000-0002-2590-1900)
- Xavier Brun (ORCID: https://orcid.org/0000-0003-1322-0304)
- Thomas Thomas
- Erika Ramirez Lozano
- Leonid Azarenkov
- Paolo Aseron
- Prerna Budhkar (ORCID: https://orcid.org/0009-0005-9816-4242)
- Mikhail Moiseev
- Ronald Kalim
- Mukesh Bhartiya
- Arun Radhakrishnan (ORCID: https://orcid.org/0000-0003-3700-2491)
- Srivatsa Srinivasa (ORCID: https://orcid.org/0000-0002-3146-6642)
- Vinayak Honkote
- Vivek De (ORCID: https://orcid.org/0000-0001-5207-1079)
- Kamakhya Prasad Sahu
- Dileep Kurian (ORCID: https://orcid.org/0009-0000-9348-8348)
- Jainaveen Sundaram
- Raül Muñoz (ORCID: https://orcid.org/0000-0003-4651-4499)
- Alba Nydia Rubio López
- Suresh Kadavakollu
Institutions
- Intel (United States) (US)
- Intel (India) (IN)
Publication Details
- Published
- 2025-02-16
- DOI
- https://doi.org/10.1109/isscc49661.2025.10904798
- Citations
- 7
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 15.89