Precise characterization of diffraction grating groove patterns

Non-equidistant and non-parallel grooves of a diffraction grating distort the diffracted wavefront. For a fixed wavelength, a grating with an arbitrary groove pattern is equivalent to a grating with perfect grooves having an effective surface profile different from the geometric one. It is shown that the previously proposed method for measuring non-equidistance can be used for simultaneous measurement of non-parallelism, and the measurement error is determined without any a priori information and fitting parameters. The demonstrated error (RMS) for the diffraction gratings with an aperture of 320 × 230 mm manufactured by us was 2 nm for the effective profile, 4 · 10<sup>-7</sup> for non-equidistance, and 4.5 · 10<sup>-7</sup> for the groove inclination angle when measuring with a spatial resolution of 0.27 mm. Rms of the wavefront distortions of the beam reflected from these gratings was 10 ± 2 nm.

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Publication Details

Journal
Optics Express
Published
2025-03-04
DOI
https://doi.org/10.1364/oe.551097
Citations
3
Primary Topic
Optical Coatings and Gratings
Type
article
Field-Weighted Citation Impact
1.98

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article

Precise characterization of diffraction grating groove patterns

Yunxia Jin, Е. А. Хазанов, Ivan Yakovlev, Аnton Kochetkov et al.
3 citations
Optics Express
Optical Coatings and Gratings
1.98
article

Precise characterization of diffraction grating groove patterns

Yunxia Jin, Е. А. Хазанов, Ivan Yakovlev, Аnton Kochetkov, Shijie Liu, Jianda Shao, Boyang Wang, A. Cheplakov, Andrey Shaikin
article en
3 citations

Abstract

Non-equidistant and non-parallel grooves of a diffraction grating distort the diffracted wavefront. For a fixed wavelength, a grating with an arbitrary groove pattern is equivalent to a grating with perfect grooves having an effective surface profile different from the geometric one. It is shown that the previously proposed method for measuring non-equidistance can be used for simultaneous measurement of non-parallelism, and the measurement error is determined without any a priori information and fitting parameters. The demonstrated error (RMS) for the diffraction gratings with an aperture of 320 × 230 mm manufactured by us was 2 nm for the effective profile, 4 · 10<sup>-7</sup> for non-equidistance, and 4.5 · 10<sup>-7</sup> for the groove inclination angle when measuring with a spatial resolution of 0.27 mm. Rms of the wavefront distortions of the beam reflected from these gratings was 10 ± 2 nm.

Optics ExpressVol. 33(6)
Shanghai Institute of Optics and Fine Mechanics (CN), Russian Academy of Arts (RU)
Ministry of Science and Higher Education of the Russian Federation, National Key Research and Development Program of China
Climate action
Openalex Percentile: Top 16%
Optical Coatings and Gratings
1.98
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