The mechanism of electrical conduction in glassy semiconductors

We argue that the dominant charge carrier in glassy semiconducting alloys is a compound particle in the form of an electron or hole bound to an intimate pair of topological lattice defects; the particle is similar to the polaron solution of the Su-Schrieffer-Heeger Hamiltonian. The spatial component of the density of states for these special polarons is determined by the length scale of spatial modulation of electronegativity caused by a separate set of standalone topological defects. The latter length scale is fixed by the cooperativity size for structural relaxation; the size is largely independent of temperature in the glass but above melting, it decreases with temperature. Thus we predict that the temperature dependence of the electrical conductivity should exhibit a jump in the slope near the glass transition; the size of the jump is predicted to increase with the fragility of the melt. The predicted values of the jump and of the conductivity itself are consistent with experiment.

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Publication Details

Journal
Proceedings of the National Academy of Sciences
Published
2025-03-04
DOI
https://doi.org/10.1073/pnas.2414650122
Primary Topic
Phase-change materials and chalcogenides
Type
article
Field-Weighted Citation Impact
0.00

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article

The mechanism of electrical conduction in glassy semiconductors

Vassiliy Lubchenko, Arkady Kurnosov
Proceedings of the National Academy of Sciences
Phase-change materials and chalcogenides
article

The mechanism of electrical conduction in glassy semiconductors

Vassiliy Lubchenko, Arkady Kurnosov
article en

Abstract

We argue that the dominant charge carrier in glassy semiconducting alloys is a compound particle in the form of an electron or hole bound to an intimate pair of topological lattice defects; the particle is similar to the polaron solution of the Su-Schrieffer-Heeger Hamiltonian. The spatial component of the density of states for these special polarons is determined by the length scale of spatial modulation of electronegativity caused by a separate set of standalone topological defects. The latter length scale is fixed by the cooperativity size for structural relaxation; the size is largely independent of temperature in the glass but above melting, it decreases with temperature. Thus we predict that the temperature dependence of the electrical conductivity should exhibit a jump in the slope near the glass transition; the size of the jump is predicted to increase with the fragility of the melt. The predicted values of the jump and of the conductivity itself are consistent with experiment.

Proceedings of the National Academy of SciencesVol. 122(10)
Wesleyan University (US), University of Houston (US)
National Science Foundation, Welch Foundation, University of Houston, Texas Center for Superconductivity, University of Houston, Division of Chemistry
Openalex Percentile: Top 97%
Phase-change materials and chalcogenides
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