General and Offset-Resistant Physical-Layer Acknowledgement Approach to Cross-Technology Communication
Cross-technology communication (CTC) enables direct communications among devices with heterogeneous wireless technologies, e.g., Bluetooth, WiFi, and ZigBee, thereby reducing the cost and complexity of their interconnections. Yet CTC is unreliable due to the technology heterogeneity, and most existing CTC designs do not provide acknowledgment (ACK) feedback to ensure reliable data transmission. Few ACK designs are only applicable to feedback for ZigBee-WiFi pair and vulnerable to sampling offsets that inherently exist in CTC. In this work, we propose a General and Offset-resistant Physical-layer ACK approach, called GOP-ACK, to support reliable communications. Its core idea lies in encoding ACK messages with offset-resistant signal that has two benefits: 1) it can be adapted to a wide range of CTC scenarios with minimal adjustment, and 2) it can be effortlessly and robustly detected even in the presence of sampling offsets. We offer practical guidelines to tackle key deployment challenges related to signal construction, efficient and robust transmission, and effective firmware module reuse, enabling the application of GOP-ACK to specific CTC scenarios. Based on them, we implement two designs: ZigBee-to-BLE and ZigBee-to-WiFi feedback, and propose a theoretical model to analyze their performance. We then conduct experiments and simulations to verify GOP-ACK’s feasibility and superiority over the state of the art, thereby enhancing the practicality of CTC greatly.
Authors
- Shumin Yao (ORCID: https://orcid.org/0000-0002-8417-4571)
- Li Feng (ORCID: https://orcid.org/0000-0002-6324-9618)
- Qinglin Zhao (ORCID: https://orcid.org/0000-0003-4873-5631)
- Aiiad Albeshri (ORCID: https://orcid.org/0000-0003-3796-0294)
- MengChu Zhou (ORCID: https://orcid.org/0000-0002-5408-8752)
- Peiyun Zhang (ORCID: https://orcid.org/0000-0002-4864-6279)
Institutions
- Macau University of Science and Technology (MO)
- New Jersey Institute of Technology (US)
- King Abdulaziz University (SA)
- Nanjing University of Information Science and Technology (CN)
- Zhejiang Gongshang University (CN)
Publication Details
- Journal
- IEEE Transactions on Communications
- Published
- 2025-03-04
- DOI
- https://doi.org/10.1109/tcomm.2025.3547765
- Citations
- 3
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 6.81
Funders
- China Postdoctoral Science Foundation
- Fundo para o Desenvolvimento das Ciências e da Tecnologia
- National Science and Technology Major Project