Graph-Based Multitask Transfer Learning for Fault Detection and Diagnosis of Few-Shot Analog Circuits
Building an interpretable fault detection and diagnostic model based on few-shot circuit samples and prior information about circuit structures is of significant importance. To fill these gaps, we propose a graph-based multitask transfer learning (TL) method for fault detection and diagnosis of circuits under few-shot conditions. First, in order to model the interconnections of nodes in a circuit, the sample data is organized into a graph structure, and a semi-supervised graph-based structural feature fusion method is proposed. The proposed method can accept graph-structured data and process the data using feature fusion methods. Second, to improve the model performance under few-shot conditions, two TL mechanisms are proposed for the topological structure characteristics of analog circuits as well as circuit signal characteristics. Finally, through a parameter-shared strategy, we propose a task transfer-based fault diagnosis approach. Experimental results on three different circuits show that the proposed method has the best diagnostic accuracy compared to typical detection and diagnosis schemes.
Authors
- Patrick Girard (ORCID: https://orcid.org/0000-0003-0722-8772)
- Byeong‐hee Roh (ORCID: https://orcid.org/0000-0003-2509-4210)
- Aibin Yan (ORCID: https://orcid.org/0000-0003-0024-987X)
- Zhengfeng Huang (ORCID: https://orcid.org/0000-0001-8695-4478)
- Guangzhu Liu (ORCID: https://orcid.org/0000-0002-5864-9377)
- Jie Cui (ORCID: https://orcid.org/0000-0001-7258-3418)
- Xiaoqing Wen (ORCID: https://orcid.org/0000-0001-8305-604X)
- Zhongyu Gao (ORCID: https://orcid.org/0009-0009-4694-5644)
Institutions
- Centre National de la Recherche Scientifique (FR)
- Anhui University (CN)
- Hefei University of Technology (CN)
- Université de Montpellier (FR)
- Kyushu Institute of Technology (JP)
- Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier (FR)
- Ajou University (KR)
Publication Details
- Journal
- IEEE Internet of Things Journal
- Published
- 2025-03-04
- DOI
- https://doi.org/10.1109/jiot.2025.3547957
- Citations
- 2
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 1.46
Funders
- National Natural Science Foundation of China