Graph-Based Multitask Transfer Learning for Fault Detection and Diagnosis of Few-Shot Analog Circuits

Building an interpretable fault detection and diagnostic model based on few-shot circuit samples and prior information about circuit structures is of significant importance. To fill these gaps, we propose a graph-based multitask transfer learning (TL) method for fault detection and diagnosis of circuits under few-shot conditions. First, in order to model the interconnections of nodes in a circuit, the sample data is organized into a graph structure, and a semi-supervised graph-based structural feature fusion method is proposed. The proposed method can accept graph-structured data and process the data using feature fusion methods. Second, to improve the model performance under few-shot conditions, two TL mechanisms are proposed for the topological structure characteristics of analog circuits as well as circuit signal characteristics. Finally, through a parameter-shared strategy, we propose a task transfer-based fault diagnosis approach. Experimental results on three different circuits show that the proposed method has the best diagnostic accuracy compared to typical detection and diagnosis schemes.

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Publication Details

Journal
IEEE Internet of Things Journal
Published
2025-03-04
DOI
https://doi.org/10.1109/jiot.2025.3547957
Citations
2
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
1.46

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article

Graph-Based Multitask Transfer Learning for Fault Detection and Diagnosis of Few-Shot Analog Circuits

Patrick Girard, Byeong‐hee Roh, Aibin Yan, Zhengfeng Huang et al.
2 citations
IEEE Internet of Things Journal
Integrated Circuits and Semiconductor Failure Analysis
1.46
article

Graph-Based Multitask Transfer Learning for Fault Detection and Diagnosis of Few-Shot Analog Circuits

Patrick Girard, Byeong‐hee Roh, Aibin Yan, Zhengfeng Huang, Guangzhu Liu, Jie Cui, Xiaoqing Wen, Zhongyu Gao
article en
2 citations

Abstract

Building an interpretable fault detection and diagnostic model based on few-shot circuit samples and prior information about circuit structures is of significant importance. To fill these gaps, we propose a graph-based multitask transfer learning (TL) method for fault detection and diagnosis of circuits under few-shot conditions. First, in order to model the interconnections of nodes in a circuit, the sample data is organized into a graph structure, and a semi-supervised graph-based structural feature fusion method is proposed. The proposed method can accept graph-structured data and process the data using feature fusion methods. Second, to improve the model performance under few-shot conditions, two TL mechanisms are proposed for the topological structure characteristics of analog circuits as well as circuit signal characteristics. Finally, through a parameter-shared strategy, we propose a task transfer-based fault diagnosis approach. Experimental results on three different circuits show that the proposed method has the best diagnostic accuracy compared to typical detection and diagnosis schemes.

IEEE Internet of Things JournalVol. 12(12)
Centre National de la Recherche Scientifique (FR), Anhui University (CN), Hefei University of Technology (CN), Université de Montpellier (FR), Kyushu Institute of Technology (JP), Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier (FR), Ajou University (KR)
National Natural Science Foundation of China
Openalex Percentile: Top 19%
Integrated Circuits and Semiconductor Failure Analysis
1.46
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