Application of XRD, SEM-EDX and FTIR techniques for mineral characterization of geological ores

Abstract The complexity of mineral processing investigations is rapidly increasing the demand for precise composition and phase distribution analysis in complicated ore assemblages. Here, we present a systematic mineralogical approach to assess the chemical composition of geological ores (namely: S-7, S-8, S-12, S-13, S-15, S-17 and S-18) by key characterization techniques including: X-ray diffraction (XRD), Scanning electron microscopy with energy dispersive X-ray analysis (SEM-EDX) and Fourier transform infrared spectroscopy (FTIR). The XRD analyses reveal that the ores are comprised of different minerals including: quartz, microcline, albite, kaolinite, muscovite, barite, fluorite, calcite and hydroxyapatite. The microstructural, morphological and surface topography are determined by SEM using secondary electron (SE) imaging while backscattered electron (BSE) imaging effectively differentiates the various regions within the ore samples according to their compositional difference. Both qualitative and quantitative elemental analyses are provided by EDX spectra. A total of 25 elements were detected, including rare-earth elements as well. Moreover, the functional groups which are the finger prints of the minerals present in the ores were investigated by FTIR spectroscopy. The IR absorption bands are well assigned and interpreted. The experimental results from XRD, SEM-EDX and FTIR are well associated with one another and successfully classify the ore samples on the basis of their lithologies.