On the split Voigt profile and its use in the analysis of X-ray diffraction patterns

The main properties (integral breadth, FWHM, Fourier transform) of the split Voigt function have been analysed. These are important in the study of the X-ray diffraction peaks. In this way, some X-ray diffraction lines of a sample of quartz and zirconia has been analysed by using single line methods, describing the instrumental-spectral asymmetric peaks by means of split Voigt functions.