Single-image reflectance and transmittance estimation from any flatbed scanner
Flatbed scanners have emerged as promising devices for high-resolution, single-image material capture. However, existing approaches assume very specific conditions, such as uniform diffuse illumination, which are only available in certain high-end devices, hindering their scalability and cost. In contrast, in this work, we introduce a method inspired by intrinsic image decomposition, which accurately removes both shading and specularity, effectively allowing captures with any flatbed scanner. Further, we extend previous work on single-image material reflectance capture with the estimation of opacity and transmittance, critical components of full material appearance (SVBSDF), improving the results for any material captured with a flatbed scanner, at a very high resolution and accuracy. • We introduce a generative model for digitizing materials using any flatbed scanners, capable of removing undesirable shading and specular highlights. • We expand the realism of digital replicas of material by including opacity and transmittance in the material model, both of which are key attributes for thin-layer materials like fabrics. • We provide an extensive and thorough experimentation using image-based and render aware metrics. Our results show that our method works with a wide range of scanning devices.
Authors
- Jorge López‐Moreno (ORCID: https://orcid.org/0000-0001-6278-6940)
- Carlos Rodríguez-Pardo (ORCID: https://orcid.org/0000-0001-6121-7738)
- Elena Garcés (ORCID: https://orcid.org/0000-0003-3509-8485)
- David Pascual-Hernández (ORCID: https://orcid.org/0000-0002-6549-1694)
- Javier Rodríguez-Vázquez (ORCID: https://orcid.org/0000-0003-0305-7806)
Institutions
- Adobe Systems (United States) (US)
- Universidad Rey Juan Carlos (ES)
- RFF-CMCC European Institute on Economics and the Environment (IT)
- CMCC Foundation - Euro-Mediterranean Center on Climate Change (IT)
- Arquimea (Spain) (ES)
- Politecnico di Milano (IT)
Publication Details
- Journal
- Computers & Graphics
- Published
- 2025-03-01
- DOI
- https://doi.org/10.1016/j.cag.2025.104186
- Citations
- 2
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 2.48
Funders
- Ministerio de Ciencia, Innovación y Universidades