Spectral X-ray computed tomography for the chemical identification of critical minerals

Differentiating minerals using high-resolution X-ray tomography (µCT) relies on distinct differences in the attenuation coefficient µ . The µ value depends on an interplay between the material density ρ and the effective atomic number Z eff of a mineral phase. Difficulties in identifying mineral phases arise when this interplay gives similar µ values and thus limited contrast within µCT images. Untangling these two dependencies is essential to improve the three-dimensional chemical identification of critical minerals. Lab-based methods and techniques often incorporate different measures, but only show a limited application potential on multiphase geological samples. Using high- Z spectral laboratory-based µCT we studied the potential of directly identifying chemical elements within the practical margins of high- Z spectral detectors. This paper compares the results from three mineral deposits using two spectral µCT setups. Chemical elements with a Z higher than molybdenum and a concentration of at least some weight percentage were correctly identified using K-edge imaging. The suitability of the different high- Z spectral detectors depends largely on the availability of prior knowledge of the sample composition. Quantifying elemental concentrations is element- and sample specific and currently does not allow for optimal automated mineralogy solutions. Improving the three-dimensional identification of minerals can be achieved with dedicated analyses of the energy-dependent µ curve and therefore will remain the focus of future work. • Comparison between different high- Z spectral laboratory-based µCT setups. • K-edge identification of chemical components with an atomic number larger than Mo. • Differentiation between mineral phases with a similar µ rec in standard µCT scans.

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Publication Details

Journal
Tomography of Materials and Structures
Published
2025-02-28
DOI
https://doi.org/10.1016/j.tmater.2025.100059
Citations
1
Primary Topic
Advanced X-ray and CT Imaging
Type
article
Field-Weighted Citation Impact
0.67

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article

Spectral X-ray computed tomography for the chemical identification of critical minerals

Matthieu Boone, Florian Buyse, Frederic Van Assche, Stijn Dewaele et al.
1 citations
Tomography of Materials and Structures
Advanced X-ray and CT Imaging
0.67
article

Spectral X-ray computed tomography for the chemical identification of critical minerals

Matthieu Boone, Florian Buyse, Frederic Van Assche, Stijn Dewaele, Veerle Cnudde, Peter Moonen, Stéphane Faucher
article en
1 citations

Abstract

Differentiating minerals using high-resolution X-ray tomography (µCT) relies on distinct differences in the attenuation coefficient µ . The µ value depends on an interplay between the material density ρ and the effective atomic number Z eff of a mineral phase. Difficulties in identifying mineral phases arise when this interplay gives similar µ values and thus limited contrast within µCT images. Untangling these two dependencies is essential to improve the three-dimensional chemical identification of critical minerals. Lab-based methods and techniques often incorporate different measures, but only show a limited application potential on multiphase geological samples. Using high- Z spectral laboratory-based µCT we studied the potential of directly identifying chemical elements within the practical margins of high- Z spectral detectors. This paper compares the results from three mineral deposits using two spectral µCT setups. Chemical elements with a Z higher than molybdenum and a concentration of at least some weight percentage were correctly identified using K-edge imaging. The suitability of the different high- Z spectral detectors depends largely on the availability of prior knowledge of the sample composition. Quantifying elemental concentrations is element- and sample specific and currently does not allow for optimal automated mineralogy solutions. Improving the three-dimensional identification of minerals can be achieved with dedicated analyses of the energy-dependent µ curve and therefore will remain the focus of future work. • Comparison between different high- Z spectral laboratory-based µCT setups. • K-edge identification of chemical components with an atomic number larger than Mo. • Differentiation between mineral phases with a similar µ rec in standard µCT scans.

Tomography of Materials and StructuresVol. 8
Centre National de la Recherche Scientifique (FR), Université de Pau et des Pays de l'Adour (FR), Utrecht University (NL), Ghent University (BE)
European Commission, Fonds Wetenschappelijk Onderzoek, Universiteit Gent, Vlaamse regering, Université de Pau et des Pays de l'Adour, Bijzonder Onderzoeksfonds UGent
Openalex Percentile: Top 34%
Advanced X-ray and CT Imaging
0.67
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