Spectral X-ray computed tomography for the chemical identification of critical minerals
Differentiating minerals using high-resolution X-ray tomography (µCT) relies on distinct differences in the attenuation coefficient µ . The µ value depends on an interplay between the material density ρ and the effective atomic number Z eff of a mineral phase. Difficulties in identifying mineral phases arise when this interplay gives similar µ values and thus limited contrast within µCT images. Untangling these two dependencies is essential to improve the three-dimensional chemical identification of critical minerals. Lab-based methods and techniques often incorporate different measures, but only show a limited application potential on multiphase geological samples. Using high- Z spectral laboratory-based µCT we studied the potential of directly identifying chemical elements within the practical margins of high- Z spectral detectors. This paper compares the results from three mineral deposits using two spectral µCT setups. Chemical elements with a Z higher than molybdenum and a concentration of at least some weight percentage were correctly identified using K-edge imaging. The suitability of the different high- Z spectral detectors depends largely on the availability of prior knowledge of the sample composition. Quantifying elemental concentrations is element- and sample specific and currently does not allow for optimal automated mineralogy solutions. Improving the three-dimensional identification of minerals can be achieved with dedicated analyses of the energy-dependent µ curve and therefore will remain the focus of future work. • Comparison between different high- Z spectral laboratory-based µCT setups. • K-edge identification of chemical components with an atomic number larger than Mo. • Differentiation between mineral phases with a similar µ rec in standard µCT scans.
Authors
- Matthieu Boone (ORCID: https://orcid.org/0000-0002-5478-4141)
- Florian Buyse (ORCID: https://orcid.org/0000-0002-3515-868X)
- Frederic Van Assche (ORCID: https://orcid.org/0000-0002-7583-3248)
- Stijn Dewaele (ORCID: https://orcid.org/0000-0002-8805-6986)
- Veerle Cnudde (ORCID: https://orcid.org/0000-0002-3269-5914)
- Peter Moonen (ORCID: https://orcid.org/0000-0002-2551-7669)
- Stéphane Faucher (ORCID: https://orcid.org/0000-0001-8887-6055)
Institutions
- Centre National de la Recherche Scientifique (FR)
- Université de Pau et des Pays de l'Adour (FR)
- Utrecht University (NL)
- Ghent University (BE)
Publication Details
- Journal
- Tomography of Materials and Structures
- Published
- 2025-02-28
- DOI
- https://doi.org/10.1016/j.tmater.2025.100059
- Citations
- 1
- Primary Topic
- Advanced X-ray and CT Imaging
- Type
- article
- Field-Weighted Citation Impact
- 0.67
Funders
- European Commission
- Fonds Wetenschappelijk Onderzoek
- Universiteit Gent
- Vlaamse regering
- Université de Pau et des Pays de l'Adour
- Bijzonder Onderzoeksfonds UGent