Frequency-Dependent Deconvolution for Enhanced THz-TDS Scans: Accounting for Beam Width Variations in Time Traces
Terahertz time-domain spectroscopy (THz-TDS) is a powerful tool for nondestructive testing, but the quality of scans is limited by beam spreading effects, which vary with frequency. We propose a deconvolution method that accounts for the changing beam width as a function of frequency. By incorporating frequency-specific Gaussian beam profiles, determined through the knife-edge technique, the proposed method enhances the spatial resolution of THz-TDS scans while keeping the ability to analyze the phase of the signals. Our approach significantly improves contrast and sharpness in both reflectance and transmission modes. This technique offers a more accurate and robust enhancement of THz-TDS imaging.
Authors
- N. Thomas (ORCID: https://orcid.org/0000-0002-0146-0071)
- Linus Leo Stöckli (ORCID: https://orcid.org/0000-0002-7916-2592)
- Arnaud Demion (ORCID: https://orcid.org/0009-0002-6920-475X)
- Silvan Zahno
Institutions
- University of Bern (CH)
- HES-SO Valais-Wallis (CH)
- International Space Science Institute (CH)
Publication Details
- Journal
- IEEE Transactions on Terahertz Science and Technology
- Published
- 2025-02-28
- DOI
- https://doi.org/10.1109/tthz.2025.3546756
- Citations
- 2
- Primary Topic
- Terahertz technology and applications
- Type
- article
- Field-Weighted Citation Impact
- 1.46