Experimental Study of the Electromagnetic Pulse Effect on an Electronic Governor

In this paper, the electromagnetic destruction effect of a typical electronic governor is investigated by means of pulsed current inj ection. Firstly, the working principle of electronic governor (ESC) is introduced, and then pulse current injection experiments are carried out with pulse amplitude and injection port as independent variables to obtain the damage threshold and damage mode of electronic governor. The threshold of the signal output port is 140A, and the threshold of the power input port is 160A. The damage mode is mainly serious degradation and direct damage. And it was found that the damaging components of the ESC were NMOS tubes, current sampling amplifiers and pre-drivers etc.