Extending Resonant Inelastic X-ray Scattering to Extreme Ultraviolet

We present α-Al2O3 XAS, XES and RIXS measurements across the Al L2/L3 edges at about 79 eV excitation energy. In the emission spectra, we identify two fluorescence peaks, corresponding to electronic transitions into the 2p core hole from mixed states of Al 3s and Al 3d character, both mixed with O 2p orbitals. Even if the XAS spectrum shows more than one resonance, surprisingly only one clear RIXS signal with energy loss equal to 10.7 eV is present in the data. Nevertheless, this allows us to tentatively extract from the measured high-resolution data the linewidths for fluorescence and RIXS transitions, with the latter being almost a factor of two smaller than the former.

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Publication Details

Journal
CHIMIA International Journal for Chemistry
Published
2025-02-26
DOI
https://doi.org/10.2533/chimia.2025.25
Primary Topic
X-ray Spectroscopy and Fluorescence Analysis
Type
article
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article

Extending Resonant Inelastic X-ray Scattering to Extreme Ultraviolet

Fabio Frassetto, Davide Bleiner, Claudio Cirelli, Marcello Coreno et al.
CHIMIA International Journal for Chemistry
X-ray Spectroscopy and Fluorescence Analysis
article

Extending Resonant Inelastic X-ray Scattering to Extreme Ultraviolet

Fabio Frassetto, Davide Bleiner, Claudio Cirelli, Marcello Coreno, F. Barbato, Sven Augustin, Gregor Knopp, Monica de Simone, Fabio La Mattina, Luca Poletto, Yunieski Arbelo Peña, Samuel Menzi, S. Orlando, Paolo Miotti
article en

Abstract

We present α-Al2O3 XAS, XES and RIXS measurements across the Al L2/L3 edges at about 79 eV excitation energy. In the emission spectra, we identify two fluorescence peaks, corresponding to electronic transitions into the 2p core hole from mixed states of Al 3s and Al 3d character, both mixed with O 2p orbitals. Even if the XAS spectrum shows more than one resonance, surprisingly only one clear RIXS signal with energy loss equal to 10.7 eV is present in the data. Nevertheless, this allows us to tentatively extract from the measured high-resolution data the linewidths for fluorescence and RIXS transitions, with the latter being almost a factor of two smaller than the former.

CHIMIA International Journal for ChemistryVol. 79(1-2)
University of Zurich (CH), AREA Science Park (IT), Paul Scherrer Institute (CH), Elettra-Sincrotrone Trieste S.C.p.A. (IT), Istituto Officina dei Materiali (IT), Institute of Structure of Matter (IT), Istituto di Fotonica e Nanotecnologie (IT), Swiss Federal Laboratories for Materials Science and Technology (CH)
Affordable and clean energy
Openalex Percentile: Top 95%
X-ray Spectroscopy and Fluorescence Analysis
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