Infrared emissivity measurement approach for solid and opaque materials

Accurate emissivity assessment is crucial for real temperature measurements using remote sensing methods and infrared signature modeling. This study introduces a novel method, to our knowledge, for determining the emissivity of materials. Samples were stabilized at 343.15 K in a temperature-controlled scientific chamber, and the emitted infrared radiation was measured using a hyperspectral infrared imaging camera and a broadband longwave infrared imaging camera, covering the wavelength ranges of 3.5-5.5 µm and 7.5-14 µm, respectively. The novelty of this approach is the integration of an infrared mirror and a blackbody within the chamber, which reduces ambient interaction effects on the emissivity measurement. This method was applied to material samples, including aluminum (6061), copper, steel (316), and plastic (PA66 GF30), with results compared to those from a previously established method and available literature data.