SnS₂/WSe₂ van der Waals Single-Detector Spectrometer With a Dynamically Selecting Spectral Reconstruction Strategy
The single-detector spectrometers based on 2D layer van der Waals (vdW) heterojunctions offer advantages in spectral reconstruction due to their high sensitivity, tunable optical properties, and the ability to cover a broad spectral range. There exist two principal algorithms dominating spectrum reconstruction for this kind spectrometer: the Tikhonov regularization method combined with the Least Squares Method (LSM) and neural network-based approaches, particularly Deep Learning (DL). However, both of the algorithms exhibit inherent limitations in spectral reconstruction, which constrain the versatility of computational spectrometers that rely solely on a single algorithm for reconstructing diverse spectral profiles. To overcome this limitation, we introduce an artificial neural network (ANN)-based classification model capable of dynamically selecting the optimal algorithm throughout the reconstruction process. This enables highly accurate spectral reconstruction within the 440-700 nm wavelength range, achieving a spectral resolution of 6 nm. By harnessing the complementary strengths of multiple algorithms, our approach proposes a novel strategy for combining techniques to enhance the precision of spectral reconstructions, laying the groundwork for more sophisticated methods in the future.
Authors
- Renjing Xu (ORCID: https://orcid.org/0000-0002-0792-8974)
- Shenghuang Lin (ORCID: https://orcid.org/0000-0001-9552-4680)
- Congwen Zhang
- Zhou Yang (ORCID: https://orcid.org/0000-0003-1229-3739)
- Haoran Mu (ORCID: https://orcid.org/0000-0001-6561-6293)
- Guangyu Zhang (ORCID: https://orcid.org/0009-0002-5296-4402)
Institutions
- Hong Kong University of Science and Technology (HK)
- Songshan Lake Materials Laboratory (CN)
- University of Hong Kong (HK)
Publication Details
- Journal
- IEEE Electron Device Letters
- Published
- 2025-02-26
- DOI
- https://doi.org/10.1109/led.2025.3545960
- Citations
- 2
- Primary Topic
- Chalcogenide Semiconductor Thin Films
- Type
- article
- Field-Weighted Citation Impact
- 1.46