Exploring Structure Diversity in Atomic Resolution Microscopy With Graph
The emergence of deep learning (DL) has provided great opportunities for the high-throughput analysis of atomic-resolution micrographs. However, the DL models trained by image patches in fixed size generally lack efficiency and flexibility when processing micrographs containing diversified atomic configurations. Herein, inspired by the similarity between the atomic structures and graphs, a few-shot learning framework based on an equivariant graph neural network (EGNN) to analyze a library of atomic structures (e.g., vacancies, phases, grain boundaries, doping, etc.) is described, showing significantly promoted robustness and three orders of magnitude reduced computing parameters compared to the image-driven DL models, which is especially evident for those aggregated vacancy lines with flexible lattice distortion. Besides, the intuitiveness of graphs enables quantitative and straightforward extraction of the atomic-scale structural features in batches, thus statistically unveiling the self-assembly dynamics of vacancy lines under electron beam irradiation. A versatile model toolkit is established by integrating EGNN sub-models for single structure recognition to process images involving varied configurations in the form of a task chain, leading to the discovery of novel doping configurations with superior electrocatalytic properties for hydrogen evolution reactions. This work provides a powerful tool to explore structure diversity in a fast, accurate, and intelligent manner.
Authors
- Zheng Luo (ORCID: https://orcid.org/0000-0001-9252-5434)
- Ming Feng (ORCID: https://orcid.org/0000-0001-7320-0378)
- Zijian Gao (ORCID: https://orcid.org/0000-0001-5151-3381)
- Huaimin Wang
- Jinyang Yu
- Dawei Feng (ORCID: https://orcid.org/0000-0002-7587-8905)
- Fangping Ouyang (ORCID: https://orcid.org/0000-0001-7904-3430)
- Jin Zhang (ORCID: https://orcid.org/0000-0003-3731-8859)
- Shanshan Wang (ORCID: https://orcid.org/0000-0002-5324-6050)
- Cheng Chen (ORCID: https://orcid.org/0000-0002-4225-3335)
- Tao Wang (ORCID: https://orcid.org/0000-0002-4789-7041)
- Shen Zhou
- Shaohua Xue (ORCID: https://orcid.org/0000-0003-1816-708X)
- Hu Liang (ORCID: https://orcid.org/0009-0002-8220-544X)
- Kele Xu (ORCID: https://orcid.org/0009-0002-0741-5279)
Institutions
- Tongji University (CN)
- Central South University (CN)
- National University of Defense Technology (CN)
- Peking University (CN)
Publication Details
- Journal
- Advanced Materials
- Published
- 2025-02-23
- DOI
- https://doi.org/10.1002/adma.202417478
- Citations
- 6
- Primary Topic
- Machine Learning in Materials Science
- Type
- article
- Field-Weighted Citation Impact
- 3.11
Funders
- National Natural Science Foundation of China
- Ministry of Science and Technology of the People's Republic of China
- National University of Defense Technology
- Science, Technology and Innovation Commission of Shenzhen Municipality
- National Science and Technology Major Project
- Beijing National Laboratory for Molecular Sciences