IGBT loss analysis and junction temperature calculation based on Simulink

Abstract The Insulated Gate Bipolar Transistor (IGBT) is a crucial component in inverter systems, and accurately modeling the IGBT in the Controller Hardware-in-the-Loop (CHIL) simulation of inverters is a key challenge. Based on an electrical model of the IGBT, this paper develops an electro-thermal coupling model for IGBT suitable for Hardware-in-the-Loop (HIL) simulation. An IGBT loss model is established, and junction temperature calculations are performed. For a specific Infineon IGBT model, the simulation results obtained from Infineon’s IPOSIM online simulation platform are compared with offline simulation results generated using a fourth-order Foster thermal model in Matlab/Simulink, verifying the accuracy of the proposed model.

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Publication Details

Journal
Journal of Physics Conference Series
Published
2025-02-01
DOI
https://doi.org/10.1088/1742-6596/2963/1/012012
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
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article

IGBT loss analysis and junction temperature calculation based on Simulink

Guochu Chen, Long Ma
1 links
Journal of Physics Conference Series
Silicon Carbide Semiconductor Technologies
article

IGBT loss analysis and junction temperature calculation based on Simulink

Guochu Chen, Long Ma
article en

Abstract

Abstract The Insulated Gate Bipolar Transistor (IGBT) is a crucial component in inverter systems, and accurately modeling the IGBT in the Controller Hardware-in-the-Loop (CHIL) simulation of inverters is a key challenge. Based on an electrical model of the IGBT, this paper develops an electro-thermal coupling model for IGBT suitable for Hardware-in-the-Loop (HIL) simulation. An IGBT loss model is established, and junction temperature calculations are performed. For a specific Infineon IGBT model, the simulation results obtained from Infineon’s IPOSIM online simulation platform are compared with offline simulation results generated using a fourth-order Foster thermal model in Matlab/Simulink, verifying the accuracy of the proposed model.

Journal of Physics Conference SeriesVol. 2963(1)
Shanghai Dianji University (CN)
Openalex Percentile: Top 97%
Silicon Carbide Semiconductor Technologies
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