IGBT loss analysis and junction temperature calculation based on Simulink
Abstract The Insulated Gate Bipolar Transistor (IGBT) is a crucial component in inverter systems, and accurately modeling the IGBT in the Controller Hardware-in-the-Loop (CHIL) simulation of inverters is a key challenge. Based on an electrical model of the IGBT, this paper develops an electro-thermal coupling model for IGBT suitable for Hardware-in-the-Loop (HIL) simulation. An IGBT loss model is established, and junction temperature calculations are performed. For a specific Infineon IGBT model, the simulation results obtained from Infineon’s IPOSIM online simulation platform are compared with offline simulation results generated using a fourth-order Foster thermal model in Matlab/Simulink, verifying the accuracy of the proposed model.
Authors
- Guochu Chen
- Long Ma (ORCID: https://orcid.org/0009-0004-5695-8274)
Institutions
- Shanghai Dianji University (CN)
Publication Details
- Journal
- Journal of Physics Conference Series
- Published
- 2025-02-01
- DOI
- https://doi.org/10.1088/1742-6596/2963/1/012012
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00