Spectral stripe-based large-range chromatic confocal displacement system with nanometer uncertainty

We present a novel, to the best of our knowledge, design of a chromatic confocal displacement system (CCDS) based on spectral stripe. In this system, confocal light collected by the dispersive lens is shaped by a Powell lens and then diffracted onto a detector in the form of a thin straight stripe. The displacement variant is converted into the change of stripe positions on the detector. Unlike the spectral profile or the diffractive spot, the spectral stripe significantly increases the pixel number for analysis and effectively suppresses random noises. Simulation and experiment results show that the positional uncertainty of the spectral stripe is dramatically reduced and reaches less than 1‰ pixel. Measurement uncertainty is less than 14.3 nm within the whole measuring range of 4 mm. It provides a new way for developing large range CCDS with nanometer uncertainty.

Authors

Publication Details

Journal
Optics Letters
Published
2025-02-24
DOI
https://doi.org/10.1364/ol.553869
Citations
1
Primary Topic
Advanced Measurement and Metrology Techniques
Type
article
Field-Weighted Citation Impact
0.71

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article

Spectral stripe-based large-range chromatic confocal displacement system with nanometer uncertainty

Tiejun Li, Zhiguang Niu, Xiaohong Liu, Ziheng Zhang et al.
1 citations
Optics Letters
Advanced Measurement and Metrology Techniques
0.71
article

Spectral stripe-based large-range chromatic confocal displacement system with nanometer uncertainty

Tiejun Li, Zhiguang Niu, Xiaohong Liu, Ziheng Zhang, Jingbo Zhou, Yuehua Li, Wei Bian
article en
1 citations

Abstract

We present a novel, to the best of our knowledge, design of a chromatic confocal displacement system (CCDS) based on spectral stripe. In this system, confocal light collected by the dispersive lens is shaped by a Powell lens and then diffracted onto a detector in the form of a thin straight stripe. The displacement variant is converted into the change of stripe positions on the detector. Unlike the spectral profile or the diffractive spot, the spectral stripe significantly increases the pixel number for analysis and effectively suppresses random noises. Simulation and experiment results show that the positional uncertainty of the spectral stripe is dramatically reduced and reaches less than 1‰ pixel. Measurement uncertainty is less than 14.3 nm within the whole measuring range of 4 mm. It provides a new way for developing large range CCDS with nanometer uncertainty.

Optics LettersVol. 50(7)
Department of Education of Hebei Province, Natural Science Foundation of Hebei Province
Openalex Percentile: Top 36%
Advanced Measurement and Metrology Techniques
0.71
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Spectral stripe-based large-range chromatic confocal displacement system with nanometer uncertainty — Tiejun Li, Zhiguang Niu, et al. · Optics Letters (2025) | TGRS Research Map | TGRS