Accuracy and consistency of effective atomic number over object size using deep silicon photon-counting detector CT
This is the first study to evaluate Z<sub>eff</sub> measurements made using a prototype whole body PCD CT system. We found that PCD CT outperformed the EID CT in terms of Z<sub>eff</sub> accuracy and consistency over the WED range on most of the insert materials. Similarly, PCD CT outperformed most previous study's findings using EID CT. The high consistency and accuracy of measured Z<sub>eff</sub> using deep silicon PCD CT could make quantitative CT increasingly possible over a large range of patient sizes.
Authors
- Giuseppe V. Toia (ORCID: https://orcid.org/0000-0001-5794-2822)
- Т. Н. Шапиро (ORCID: https://orcid.org/0000-0002-4005-8114)
- Scott Slavic
- Timothy P. Szczykutowicz (ORCID: https://orcid.org/0000-0002-3008-6568)
- Meghan G. Lubner (ORCID: https://orcid.org/0000-0003-3788-2871)
- Zhye Yin (ORCID: https://orcid.org/0000-0003-1524-9258)
- A. M. Salyapongse (ORCID: https://orcid.org/0000-0002-4071-6498)
Institutions
- University of Wisconsin–Madison (US)
- General Electric (Spain) (ES)
- University of Wisconsin Health (US)
- GE Global Research (United States) (US)
Publication Details
- Journal
- Physica Medica
- Published
- 2025-02-21
- DOI
- https://doi.org/10.1016/j.ejmp.2025.104945
- Citations
- 5
- Primary Topic
- Advanced X-ray and CT Imaging
- Type
- article
- Field-Weighted Citation Impact
- 3.37
Funders
- GE Healthcare