Verification of SPI Protocol Using Universal Verification Methodology for Modern IoT and Wearable Devices
The Serial Peripheral Interface (SPI) protocol plays a crucial role in wearable and IoT devices, enabling high-speed communication between microcontrollers and peripherals such as sensors, displays, and connectivity modules. With the increasing complexity of modern devices and system-on-chip (SoC) designs, robust verification methods are essential to ensure functionality and reliability. This paper utilizes the Universal Verification Methodology (UVM) to develop a scalable and reusable testbench for SPI verification. The process encompasses test planning, simulation, emulation, and top-level verification to validate multi-slave coordination and error-handling scenarios. The results demonstrate the critical importance of UVM in ensuring the performance and dependability of SPI in advanced electronics, contributing to the reliable integration of the protocol in future devices. The verification results demonstrated a functional coverage of 83.33% and 100% assertion coverage, confirming our approach’s robustness. Analysis of the uncovered functional bins revealed that specific edge cases, such as timing violations and multi-slave arbitration conflicts, require additional test scenarios for full verification. Furthermore, our testbench successfully identified and handled critical fault conditions, such as clock jitter, bus contention, and framing errors, ensuring reliable SPI operation in real-world deployments. These findings highlight the effectiveness of UVM-based verification in improving the reliability and robustness of SPI communication in modern low-power, resource-constrained embedded systems.
Authors
- Chin-Wen Liao (ORCID: https://orcid.org/0000-0003-4264-3146)
- Yu-Cheng Liao (ORCID: https://orcid.org/0000-0002-5148-2375)
- Haicun Yu
Institutions
- Cisco Systems (United States) (US)
- National Changhua University of Education (TW)
Publication Details
- Journal
- Electronics
- Published
- 2025-02-20
- DOI
- https://doi.org/10.3390/electronics14050837
- Citations
- 2
- Primary Topic
- Embedded Systems Design Techniques
- Type
- article
- Field-Weighted Citation Impact
- 4.54