A Paste-like Polymeric Resist with High Thermal Endurance for Vapor-Phase Bottom-Up Fabrication

Bottom-up microfabrication based on vapor-phase depositions (e.g., sputtering and atomic layer deposition) requires patterning resists that can endure the parasitic thermal treatment during deposition. Conventional polymeric resists encounter removability issues due to thermally induced carbonization at the interface, while emerging molecular resists face challenges of hermeticity and shape retention in bulk. Here, we introduce a paste-like patterning resist with high interfacial and bulk thermal stability, which leads to multifaceted processing characteristics: this resist is hermetic and shape-preservable during the deposition and easily removable after the deposition. Based on a wetting-driven self-assembly process, we develop a nonphotolithographic patterning procedure for this paste resist and demonstrate high-accuracy and defect-free bottom-up patterning of dielectrics, semiconductors, and conductors. Beyond vapor-phase depositions, this resist is compatible with most manufacturing techniques, providing fruitful implications for bottom-up microfabrication.

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Publication Details

Journal
Nano Letters
Published
2025-02-21
DOI
https://doi.org/10.1021/acs.nanolett.4c06189
Citations
5
Primary Topic
Semiconductor materials and devices
Type
article
Field-Weighted Citation Impact
3.65

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article

A Paste-like Polymeric Resist with High Thermal Endurance for Vapor-Phase Bottom-Up Fabrication

Paddy K. L. Chan, Lizhi Yan, Yanhao Yu, Xing Cheng et al.
5 citations
Nano Letters
Semiconductor materials and devices
3.65
article

A Paste-like Polymeric Resist with High Thermal Endurance for Vapor-Phase Bottom-Up Fabrication

Paddy K. L. Chan, Lizhi Yan, Yanhao Yu, Xing Cheng, Yan Shao, J. Yao, Chun Li, Ming Chen, Rui Xia, Zixin Zhang, Haochuan Wang
article en
5 citations

Abstract

Bottom-up microfabrication based on vapor-phase depositions (e.g., sputtering and atomic layer deposition) requires patterning resists that can endure the parasitic thermal treatment during deposition. Conventional polymeric resists encounter removability issues due to thermally induced carbonization at the interface, while emerging molecular resists face challenges of hermeticity and shape retention in bulk. Here, we introduce a paste-like patterning resist with high interfacial and bulk thermal stability, which leads to multifaceted processing characteristics: this resist is hermetic and shape-preservable during the deposition and easily removable after the deposition. Based on a wetting-driven self-assembly process, we develop a nonphotolithographic patterning procedure for this paste resist and demonstrate high-accuracy and defect-free bottom-up patterning of dielectrics, semiconductors, and conductors. Beyond vapor-phase depositions, this resist is compatible with most manufacturing techniques, providing fruitful implications for bottom-up microfabrication.

Nano LettersVol. 25(9)
Harbin Institute of Technology (CN), Southern University of Science and Technology (CN), Nano and Advanced Materials Institute (CN), University of Hong Kong (HK)
National Natural Science Foundation of China, Natural Science Foundation of Guangdong Province, Science, Technology and Innovation Commission of Shenzhen Municipality
Openalex Percentile: Top 8%
Semiconductor materials and devices
3.65
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