Improving the SRAM Layout Design using Cadence Virtuoso
The explosive growth in semiconductor technology has fuelled the need for high-speed, low-power, and small form factor memory solutions, and Static Random Access Memory (SRAM) is an indispensable part of contemporary integrated circuits. The conventional SRAM structures are beset with formidable power consumption, area, and stability trade-offs at different Process, Voltage, and Temperature (PVT) conditions. This paper introduces an optimized method for SRAM layout design with Cadence Virtuoso for 6T, 7T, 8T, and 10T SRAM cells to improve their performance in power-constrained and highspeed applications. The methodology uses layout optimization methods like transistor sizing, W/H ratio tuning, and power-conscious circuit design to obtain a balanced trade-off between read/write stability, leakage power minimization, and access speed enhancement. Detailed simulations are performed with varying PVT to analyse the effects of such variations on energy efficiency, area saving, and reliability. The results show that there is substantial improvement in the cell stability and power consumption and the optimized structures are suitable for next-generation high-performance and low-power computing devices.
Authors
- R N Nandhini
Publication Details
- Journal
- International Journal for Research in Applied Science and Engineering Technology
- Published
- 2025-02-21
- DOI
- https://doi.org/10.22214/ijraset.2025.67014
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 0.00