Modeling and Analysis of Open-End Microstrip line Discontinuity on Multilayer Semiconductor Substrate for Microwave Integrated Circuits

In this paper, the modelling and analysis of open-end microstrip line discontinuity on multilayer semiconductor substrate is presented. The equivalent lumped circuit model is used to compute the frequency dependent reflection coefficient from the open-end microstrip line discontinuity. The lumped circuit elements, capacitance, inductance and resistance, are computed using closed-form expressions in term of the width of microstrip line discontinuity and thickness of the dielectric substrate. To compute the characteristic impedance of microstrip line on multilayer dielectric substrate, static Spectral Domain Analysis (SDA) method and Single Layer Reduction (SLR) techniques are used.